Nanostructure formation due to impact of highly charged ions on mica

R. Ritter; G. Kowarik; W. Meissl; A. S. El-Said; L. Maunoury; H. Lebius; C. Dufour; M. Toulemonde; F. Aumayr

doi:10.1016/j.vacuum.2009.10.018

Nanostructure formation due to impact of highly charged ions on mica

R. Ritter
, G. Kowarik
, W. Meissl
, A. S. El-Said
, L. Maunoury
, H. Lebius
, C. Dufour
, M. Toulemonde
, F. Aumayr^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

35 Scopus citations

Abstract

Muscovite mica was irradiated with slow highly charged Ar^q+ (charge state q = 12, 16) and Xe^q+ (q = 23, 27) ions in a kinetic energy range of 150-216 keV and subsequently observed by contact mode atomic force microscopy. Surprisingly, on samples irradiated with Xe ions nano-sized hillock-like structures were found well below the charge state threshold reported in earlier experimental investigations. However, the structures found are not the result of a true topographic surface modification induced by the ion bombardment, because the absence of these nanostructures in tapping mode images and the dependence of the detected structures on scan conditions points towards a surface modification which manifests itself only in frictional forces and therefore in height measurement artifacts. Furthermore the generated defects are not stable but can be erased by continuous scanning.

Original language	English
Pages (from-to)	1062-1065
Number of pages	4
Journal	Vacuum
Volume	84
Issue number	8
DOIs	https://doi.org/10.1016/j.vacuum.2009.10.018
State	Published - 24 Mar 2010
Externally published	Yes

Bibliographical note

Funding Information:
The experiments have been performed at the ARIBE facility, an installation of the distributed LEIF Infrastructure. The support received from the ITS-LEIF Project (RII3 – 026015) and from Austrian FWF and ÖAW is gratefully acknowledged. R.R. is a recipent of a DOC-fellowship of ÖAW at the Institute of Applied Physics at Vienna University of Technology.

Keywords

AFM
Feature erasure
Friction
Hillocks
Mica
Nanostructuring

ASJC Scopus subject areas

Instrumentation
Condensed Matter Physics
Surfaces, Coatings and Films

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10.1016/j.vacuum.2009.10.018

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title = "Nanostructure formation due to impact of highly charged ions on mica",

abstract = "Muscovite mica was irradiated with slow highly charged Arq+ (charge state q = 12, 16) and Xeq+ (q = 23, 27) ions in a kinetic energy range of 150-216 keV and subsequently observed by contact mode atomic force microscopy. Surprisingly, on samples irradiated with Xe ions nano-sized hillock-like structures were found well below the charge state threshold reported in earlier experimental investigations. However, the structures found are not the result of a true topographic surface modification induced by the ion bombardment, because the absence of these nanostructures in tapping mode images and the dependence of the detected structures on scan conditions points towards a surface modification which manifests itself only in frictional forces and therefore in height measurement artifacts. Furthermore the generated defects are not stable but can be erased by continuous scanning.",

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author = "R. Ritter and G. Kowarik and W. Meissl and El-Said, \{A. S.\} and L. Maunoury and H. Lebius and C. Dufour and M. Toulemonde and F. Aumayr",

note = "Funding Information: The experiments have been performed at the ARIBE facility, an installation of the distributed LEIF Infrastructure. The support received from the ITS-LEIF Project (RII3 – 026015) and from Austrian FWF and {\"O}AW is gratefully acknowledged. R.R. is a recipent of a DOC-fellowship of {\"O}AW at the Institute of Applied Physics at Vienna University of Technology.",

year = "2010",

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day = "24",

doi = "10.1016/j.vacuum.2009.10.018",

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T1 - Nanostructure formation due to impact of highly charged ions on mica

AU - Ritter, R.

AU - Kowarik, G.

AU - Meissl, W.

AU - El-Said, A. S.

AU - Maunoury, L.

AU - Lebius, H.

AU - Dufour, C.

AU - Toulemonde, M.

AU - Aumayr, F.

N1 - Funding Information: The experiments have been performed at the ARIBE facility, an installation of the distributed LEIF Infrastructure. The support received from the ITS-LEIF Project (RII3 – 026015) and from Austrian FWF and ÖAW is gratefully acknowledged. R.R. is a recipent of a DOC-fellowship of ÖAW at the Institute of Applied Physics at Vienna University of Technology.

PY - 2010/3/24

Y1 - 2010/3/24

N2 - Muscovite mica was irradiated with slow highly charged Arq+ (charge state q = 12, 16) and Xeq+ (q = 23, 27) ions in a kinetic energy range of 150-216 keV and subsequently observed by contact mode atomic force microscopy. Surprisingly, on samples irradiated with Xe ions nano-sized hillock-like structures were found well below the charge state threshold reported in earlier experimental investigations. However, the structures found are not the result of a true topographic surface modification induced by the ion bombardment, because the absence of these nanostructures in tapping mode images and the dependence of the detected structures on scan conditions points towards a surface modification which manifests itself only in frictional forces and therefore in height measurement artifacts. Furthermore the generated defects are not stable but can be erased by continuous scanning.

AB - Muscovite mica was irradiated with slow highly charged Arq+ (charge state q = 12, 16) and Xeq+ (q = 23, 27) ions in a kinetic energy range of 150-216 keV and subsequently observed by contact mode atomic force microscopy. Surprisingly, on samples irradiated with Xe ions nano-sized hillock-like structures were found well below the charge state threshold reported in earlier experimental investigations. However, the structures found are not the result of a true topographic surface modification induced by the ion bombardment, because the absence of these nanostructures in tapping mode images and the dependence of the detected structures on scan conditions points towards a surface modification which manifests itself only in frictional forces and therefore in height measurement artifacts. Furthermore the generated defects are not stable but can be erased by continuous scanning.

KW - AFM

KW - Feature erasure

KW - Friction

KW - Hillocks

KW - Mica

KW - Nanostructuring

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DO - 10.1016/j.vacuum.2009.10.018

M3 - Article

AN - SCOPUS:77949266030

SN - 0042-207X

VL - 84

SP - 1062

EP - 1065

JO - Vacuum

JF - Vacuum

IS - 8

ER -

Nanostructure formation due to impact of highly charged ions on mica

Abstract

Bibliographical note

Keywords

ASJC Scopus subject areas

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