Multi-RIS-Aided Wireless Systems: Statistical Characterization and Performance Analysis

  • Tri Nhu Do*
  • , Georges Kaddoum
  • , Thanh Luan Nguyen
  • , Daniel Benevides Da Costa
  • , Zygmunt J. Haas
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

205 Scopus citations

Abstract

In this paper, we study the statistical characterization and modeling of distributed multi-reconfigurable intelligent surface (RIS)-aided wireless systems. Specifically, we consider a practical system model where the RISs with different geometric sizes are distributively deployed, and wireless channels associated to different RISs are assumed to be independent but not identically distributed (i.n.i.d.). We propose two purpose-oriented multi-RIS-aided schemes, namely, the exhaustive RIS-aided (ERA) and opportunistic RIS-aided (ORA) schemes. A mathematical framework, which relies on the method of moments, is proposed to statistically characterize the end-to-end (e2e) channels of these schemes. It is shown that either a Gamma distribution or a Log-Normal distribution can be used to approximate the distribution of the magnitude of the e2e channel coefficients in both schemes. With these findings, we evaluate the performance of the two schemes in terms of outage probability (OP) and ergodic capacity (EC), where tight approximate closed-form expressions for the OP and EC are derived. Representative results show that the ERA scheme outperforms the ORA scheme in terms of OP and EC. In addition, under i.n.i.d. fading channels, the reflecting element settings and location settings of RISs have a significant impact on the system performance of both the ERA or ORA schemes.

Original languageEnglish
Pages (from-to)8641-8658
Number of pages18
JournalIEEE Transactions on Communications
Volume69
Issue number12
DOIs
StatePublished - 1 Dec 2021
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 1972-2012 IEEE.

Keywords

  • Gamma distribution
  • Log-Normal distribution
  • Reconfigurable intelligent surfaces (RIS)
  • ergodic capacity
  • method of moments
  • multi-RIS
  • outage probability

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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