Mott-Schottky analysis of passive films on Cu containing Fe-20Cr-xCu (x50, 4) alloys

I. H. Toor; M. Ejaz; H. S. Kwon

doi:10.1179/1743278214Y.0000000154

Mott-Schottky analysis of passive films on Cu containing Fe-20Cr-xCu (x50, 4) alloys

I. H. Toor^*
, M. Ejaz
, H. S. Kwon

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

32 Scopus citations

Abstract

Effect of copper on the defect density of Fe-20Cr-xCu (x50, 4) stainless steel alloys was investigated in deaerated pH 8?5 borate buffer solution at room temperature using Mott-Schottky analysis. Mott-Schottky analysis revealed that the addition of copper increased the acceptor density (NA, V_Cr ^-3), i.e. decreased the Cr⁺³ content of the passive film. Also the donor densities, shallow donor (N_D1, V_O ⁺²) and deep donor (N_D2, V_Cr⁺⁶), of the passive films formed were increased. XPS analysis confirmed the decrease in Cr content and enrichment of copper in the passive film of Cu containing alloys, which ultimately dictated their lower corrosion resistance, i.e. decreased film protectiveness and stability.

Original language	English
Pages (from-to)	390-395
Number of pages	6
Journal	Corrosion Engineering Science and Technology
Volume	49
Issue number	5
DOIs	https://doi.org/10.1179/1743278214Y.0000000154
State	Published - Aug 2014

Keywords

Copper
Fe-Cr alloys
Impedance
Mott-Schottky analysis
Passive films
Semiconducting properties
Stainless steel
XPS

ASJC Scopus subject areas

General Chemistry
General Chemical Engineering
General Materials Science

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10.1179/1743278214Y.0000000154

Cite this

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title = "Mott-Schottky analysis of passive films on Cu containing Fe-20Cr-xCu (x50, 4) alloys",

abstract = "Effect of copper on the defect density of Fe-20Cr-xCu (x50, 4) stainless steel alloys was investigated in deaerated pH 8?5 borate buffer solution at room temperature using Mott-Schottky analysis. Mott-Schottky analysis revealed that the addition of copper increased the acceptor density (NA, VCr -3), i.e. decreased the Cr+3 content of the passive film. Also the donor densities, shallow donor (ND1, VO +2) and deep donor (ND2, VCr+6), of the passive films formed were increased. XPS analysis confirmed the decrease in Cr content and enrichment of copper in the passive film of Cu containing alloys, which ultimately dictated their lower corrosion resistance, i.e. decreased film protectiveness and stability.",

keywords = "Copper, Fe-Cr alloys, Impedance, Mott-Schottky analysis, Passive films, Semiconducting properties, Stainless steel, XPS",

author = "Toor, \{I. H.\} and M. Ejaz and Kwon, \{H. S.\}",

year = "2014",

month = aug,

doi = "10.1179/1743278214Y.0000000154",

language = "English",

volume = "49",

pages = "390--395",

journal = "Corrosion Engineering Science and Technology",

issn = "1478-422X",

publisher = "SAGE Publications Ltd",

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TY - JOUR

T1 - Mott-Schottky analysis of passive films on Cu containing Fe-20Cr-xCu (x50, 4) alloys

AU - Toor, I. H.

AU - Ejaz, M.

AU - Kwon, H. S.

PY - 2014/8

Y1 - 2014/8

N2 - Effect of copper on the defect density of Fe-20Cr-xCu (x50, 4) stainless steel alloys was investigated in deaerated pH 8?5 borate buffer solution at room temperature using Mott-Schottky analysis. Mott-Schottky analysis revealed that the addition of copper increased the acceptor density (NA, VCr -3), i.e. decreased the Cr+3 content of the passive film. Also the donor densities, shallow donor (ND1, VO +2) and deep donor (ND2, VCr+6), of the passive films formed were increased. XPS analysis confirmed the decrease in Cr content and enrichment of copper in the passive film of Cu containing alloys, which ultimately dictated their lower corrosion resistance, i.e. decreased film protectiveness and stability.

AB - Effect of copper on the defect density of Fe-20Cr-xCu (x50, 4) stainless steel alloys was investigated in deaerated pH 8?5 borate buffer solution at room temperature using Mott-Schottky analysis. Mott-Schottky analysis revealed that the addition of copper increased the acceptor density (NA, VCr -3), i.e. decreased the Cr+3 content of the passive film. Also the donor densities, shallow donor (ND1, VO +2) and deep donor (ND2, VCr+6), of the passive films formed were increased. XPS analysis confirmed the decrease in Cr content and enrichment of copper in the passive film of Cu containing alloys, which ultimately dictated their lower corrosion resistance, i.e. decreased film protectiveness and stability.

KW - Copper

KW - Fe-Cr alloys

KW - Impedance

KW - Mott-Schottky analysis

KW - Passive films

KW - Semiconducting properties

KW - Stainless steel

KW - XPS

UR - https://www.scopus.com/pages/publications/84904760962

U2 - 10.1179/1743278214Y.0000000154

DO - 10.1179/1743278214Y.0000000154

M3 - Article

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SN - 1478-422X

VL - 49

SP - 390

EP - 395

JO - Corrosion Engineering Science and Technology

JF - Corrosion Engineering Science and Technology

IS - 5

ER -

Mott-Schottky analysis of passive films on Cu containing Fe-20Cr-xCu (x50, 4) alloys

Abstract

Keywords

ASJC Scopus subject areas

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