Modulating structural and dielectric properties of CrFeO3 materials via Ni2+ substitution: Insights from rietveld refinement, elemental and spectral evaluation for high-frequency applications

Norah Algethami, Noman Javed, Ghulam Mustafa, Ghulam Abbas Ashraf, Shagufta Gulbadan, Syed Kashif Ali, Muhammad Arshad, Imed Boukhris, M. Irfan, Muhammad Younas, Majid Niaz Akhtar, Muhammad Azhar Khan*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Nanomaterials of CrFe1-xNixO3 (where x = 0.0, 0.1, 0.3, and 0.5) with nickel (Ni) substitution were fabricated via Auto-ignition. Sintering at 700 °C for 4 h stabilized the CrNixFe1-xO3 phase in the fabricated samples. X-ray diffraction confirmed each sample's pure rhombohedral crystal. The crystallite dimensions of the fabricated samples were within the nanometer scale (41–46 nm). The X-ray density of the material fluctuates between 4.22 and 4.86 g/cm³ due to the incorporation of Ni2⁺ ions. Rietveld refinement supported the pure-phase rhombohedral structure of the materials. Infrared spectroscopy indicated that the vibrational band ʋ2 experienced a shift from 429 to 441 cm⁻1 due to Ni2⁺ substitution at the octahedral sites, whereas the band ʋ1 exhibited only minor variations. XPS elucidated all metal ions' appearance and electronic configurations within the samples. Electrical transport properties were assessed at microwave frequencies, with dielectric parameters optimized about frequency and Ni2+ substitution. Integrating Ni into CrNixFe1-xO3 (0.0 ≤ x ≤ 0.5) materials increases the ε′, with the maximum value attained at x = 0.3. Impedance measurements and Cole-Cole plots elucidated the contributions from grain boundaries. The materials demonstrated a minimum reflection loss of −37 dB, indicating their potential suitability for microwave absorption applications.

Original languageEnglish
JournalCeramics International
DOIs
StateAccepted/In press - 2025

Bibliographical note

Publisher Copyright:
© 2025 Elsevier Ltd and Techna Group S.r.l.

Keywords

  • Infrared spectroscopy
  • Rietveld refinement
  • X-ray photoelectron spectroscopy
  • XRD

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Process Chemistry and Technology
  • Surfaces, Coatings and Films
  • Materials Chemistry

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