Abstract
DC microgrid has become a preferred choice over AC microgrid, due to the growth of critical DC loads and higher efficiency during power distribution. However, the transient behavior of DC microgrid is more severe than AC microgrid, which makes the correct DC Circuit Breaker (DCCB) selection very important. In this research paper, we have proposed an evaluation method to select a commercially available DCCB by using simulation results of the stresses subjected to DCCB in low voltage DC microgrid (LVDCM). A LVDCM having AC utility grid, photovoltaic (PV) and battery-storage was modeled. A DCCB model using Schwarz's Black Box arc model was applied in the LVDCM, and its parameters were determined by using parameter sweep method. Voltage and current stresses subjected to DCCBs were analyzed and compared with DCCB's capability based on its datasheet. An appropriate DCCB was selected by comparing the voltage and current stresses with DCCB's datasheet limit.
| Original language | English |
|---|---|
| Title of host publication | CMD 2016 - International Conference on Condition Monitoring and Diagnosis |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 295-298 |
| Number of pages | 4 |
| ISBN (Electronic) | 9781509033980 |
| DOIs | |
| State | Published - 28 Nov 2016 |
| Externally published | Yes |
| Event | 2016 International Conference on Condition Monitoring and Diagnosis, CMD 2016 - Xi'an, China Duration: 25 Sep 2016 → 28 Sep 2016 |
Publication series
| Name | CMD 2016 - International Conference on Condition Monitoring and Diagnosis |
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Conference
| Conference | 2016 International Conference on Condition Monitoring and Diagnosis, CMD 2016 |
|---|---|
| Country/Territory | China |
| City | Xi'an |
| Period | 25/09/16 → 28/09/16 |
Bibliographical note
Publisher Copyright:© 2016 IEEE.
Keywords
- Current stress
- Schwarz's black box arc model
- electrical fault
- low voltage DC microgrid
- low voltage DCCB
- voltage stress
ASJC Scopus subject areas
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering
- Safety, Risk, Reliability and Quality