Micro-PIXE analysis of a single crystal of Y1Ba2Cu3O7-δ superconductor

M. Faiz; M. Ahmed; M. A. Al-Ohali

doi:10.1016/0168-583X(96)00051-1

Micro-PIXE analysis of a single crystal of Y₁Ba₂Cu₃O_7-δ superconductor

M. Faiz^*
, M. Ahmed
, M. A. Al-Ohali

^*Corresponding author for this work

King Fahd University of Petroleum & Minerals

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

A single crystal sample of Y₁Ba₂Cu₃O_7-δ superconductor was analyzed using a scanning proton microbeam and the PIXE technique. Micrographs of the crystal surface obtained by SEM revealed a small secondary crystal overgrowth on the main crystal. Micro-PIXE measurements of elemental composition and distribution profiles were carried out on the main base crystal, the smaller crystal overgrowth and in the interface region between them. In addition to Y, Ba and Cu, Au and traces of Cr and Fe were also detected in all three areas. Distributions of Y, Ba, Cu and Au were found to be uniform over both the main crystal and its overgrowth. However, the interface region exhibited strong anomalies in the distribution patterns of these elements.

Original language	English
Pages (from-to)	138-142
Number of pages	5
Journal	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume	114
Issue number	1-2
DOIs	https://doi.org/10.1016/0168-583X(96)00051-1
State	Published - Jun 1996

ASJC Scopus subject areas

Nuclear and High Energy Physics
Instrumentation

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10.1016/0168-583X(96)00051-1

Cite this

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title = "Micro-PIXE analysis of a single crystal of Y1Ba2Cu3O7-δ superconductor",

abstract = "A single crystal sample of Y1Ba2Cu3O7-δ superconductor was analyzed using a scanning proton microbeam and the PIXE technique. Micrographs of the crystal surface obtained by SEM revealed a small secondary crystal overgrowth on the main crystal. Micro-PIXE measurements of elemental composition and distribution profiles were carried out on the main base crystal, the smaller crystal overgrowth and in the interface region between them. In addition to Y, Ba and Cu, Au and traces of Cr and Fe were also detected in all three areas. Distributions of Y, Ba, Cu and Au were found to be uniform over both the main crystal and its overgrowth. However, the interface region exhibited strong anomalies in the distribution patterns of these elements.",

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T1 - Micro-PIXE analysis of a single crystal of Y1Ba2Cu3O7-δ superconductor

AU - Faiz, M.

AU - Ahmed, M.

AU - Al-Ohali, M. A.

PY - 1996/6

Y1 - 1996/6

N2 - A single crystal sample of Y1Ba2Cu3O7-δ superconductor was analyzed using a scanning proton microbeam and the PIXE technique. Micrographs of the crystal surface obtained by SEM revealed a small secondary crystal overgrowth on the main crystal. Micro-PIXE measurements of elemental composition and distribution profiles were carried out on the main base crystal, the smaller crystal overgrowth and in the interface region between them. In addition to Y, Ba and Cu, Au and traces of Cr and Fe were also detected in all three areas. Distributions of Y, Ba, Cu and Au were found to be uniform over both the main crystal and its overgrowth. However, the interface region exhibited strong anomalies in the distribution patterns of these elements.

AB - A single crystal sample of Y1Ba2Cu3O7-δ superconductor was analyzed using a scanning proton microbeam and the PIXE technique. Micrographs of the crystal surface obtained by SEM revealed a small secondary crystal overgrowth on the main crystal. Micro-PIXE measurements of elemental composition and distribution profiles were carried out on the main base crystal, the smaller crystal overgrowth and in the interface region between them. In addition to Y, Ba and Cu, Au and traces of Cr and Fe were also detected in all three areas. Distributions of Y, Ba, Cu and Au were found to be uniform over both the main crystal and its overgrowth. However, the interface region exhibited strong anomalies in the distribution patterns of these elements.

UR - https://www.scopus.com/pages/publications/0030564040

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JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

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