Abstract
Nano-scale manipulation and property measurements of individual nanowire-like structure is challenged by the small size of the structure. Scanning probe microscopy has been the dominant tool for property characterizations of nanomaterials. We have developed an alternative novel approach that allows a direct measurement of the mechanical and electrical properties of individual nanowire-like structures by in situ transmission electron microscopy (TEM). The technique is unique in a way that it can directly correlate the atomic-scale microstructure of the nanowire with its physical properties. This paper reviews our current progress in applying the technique in investigating the mechanical and electron field emission properties of carbon nanotubes and nanowires.
| Original language | English |
|---|---|
| Pages (from-to) | 3-10 |
| Number of pages | 8 |
| Journal | Materials Science and Engineering C |
| Volume | 16 |
| Issue number | 1-2 |
| DOIs | |
| State | Published - 20 Oct 2001 |
| Externally published | Yes |
Bibliographical note
Funding Information:Thanks to Professor J.L. Gole and Mr. J.D. Scout for providing the SiC nanowire specimens and Dr. Liming Dai for the carbon nanotube specimens. RPG thanks the partial support from China NSF. Thanks for the financial support of NSF Grants DMR-9971412 and DMR-9733160. Thanks to the Georgia Tech Electron Microscopy Center for providing the research facility.
Keywords
- Carbon nanotubes
- Emission properties
- Nanowires
ASJC Scopus subject areas
- General Medicine