Magnetization of Zn1−xMnxTe

  • G. D. Khattak*
  • , V. Keith
  • , Ph Martin
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

The magnetization of the diluted semimagnetic semiconductors (DMS) Zn1−xMnxTe, x = 0.02, 0.05, 0.10, 0.20, and 0.60, is measured in the temperature range 4.2 to 30 K, the magnetic field varying from 0 to 5 T. It is compared with the magnetization of Cd1−xMnxSe and Cd1−xMnxTe measured earlier for the same temperature and magnetic field ranges. The measured magnetization is fitted with a phenomenological Brillouin function using a least‐s quares method, with S0 and T0 as fitting parameters. The saturation spin value S0 is found to decrease with increasing manganese concentration for all the three series and a qualitative increase as a function of temperature is observed. However, T0 did not show any quantitative or qualitative features as a function of either Mn concentration or temperature.

Original languageEnglish
Pages (from-to)169-176
Number of pages8
JournalPhysica Status Solidi (A) Applied Research
Volume130
Issue number1
DOIs
StatePublished - 16 Mar 1992

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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