Magnetic nanowire based high resolution magnetic force microscope probes

G. Yang; J. Tang; S. Kato; Q. Zhang; L. C. Qin; M. Woodson; J. Liu; J. W. Kim; P. T. Littlehei; C. Park; O. Zhou

doi:10.1063/1.2043237

Magnetic nanowire based high resolution magnetic force microscope probes

G. Yang^*
, J. Tang
, S. Kato
, Q. Zhang
, L. C. Qin
, M. Woodson
, J. Liu
, J. W. Kim
, P. T. Littlehei
, C. Park
, O. Zhou

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

29 Scopus citations

Abstract

We report an efficient process for controlled fabrication of high-resolution magnetic force microscope probes using preformed magnetic nanowires. Nickel and cobalt nanowires produced by electrodeposition were directly assembled onto the tip of a commercial atomic force microscope cantilever with controlled orientation and length by dielectrophoresis. The properties of these nanowire-based probes are characterized.

Original language	English
Article number	123507
Pages (from-to)	1-3
Number of pages	3
Journal	Applied Physics Letters
Volume	87
Issue number	12
DOIs	https://doi.org/10.1063/1.2043237
State	Published - 19 Sep 2005
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.2043237

Cite this

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title = "Magnetic nanowire based high resolution magnetic force microscope probes",

abstract = "We report an efficient process for controlled fabrication of high-resolution magnetic force microscope probes using preformed magnetic nanowires. Nickel and cobalt nanowires produced by electrodeposition were directly assembled onto the tip of a commercial atomic force microscope cantilever with controlled orientation and length by dielectrophoresis. The properties of these nanowire-based probes are characterized.",

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T1 - Magnetic nanowire based high resolution magnetic force microscope probes

AU - Yang, G.

AU - Tang, J.

AU - Kato, S.

AU - Zhang, Q.

AU - Qin, L. C.

AU - Woodson, M.

AU - Liu, J.

AU - Kim, J. W.

AU - Littlehei, P. T.

AU - Park, C.

AU - Zhou, O.

PY - 2005/9/19

Y1 - 2005/9/19

N2 - We report an efficient process for controlled fabrication of high-resolution magnetic force microscope probes using preformed magnetic nanowires. Nickel and cobalt nanowires produced by electrodeposition were directly assembled onto the tip of a commercial atomic force microscope cantilever with controlled orientation and length by dielectrophoresis. The properties of these nanowire-based probes are characterized.

AB - We report an efficient process for controlled fabrication of high-resolution magnetic force microscope probes using preformed magnetic nanowires. Nickel and cobalt nanowires produced by electrodeposition were directly assembled onto the tip of a commercial atomic force microscope cantilever with controlled orientation and length by dielectrophoresis. The properties of these nanowire-based probes are characterized.

UR - https://www.scopus.com/pages/publications/28344449369

U2 - 10.1063/1.2043237

DO - 10.1063/1.2043237

M3 - Article

AN - SCOPUS:28344449369

SN - 0003-6951

VL - 87

SP - 1

EP - 3

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 12

M1 - 123507

ER -

Magnetic nanowire based high resolution magnetic force microscope probes

Abstract

ASJC Scopus subject areas

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