Lower bound of sample thickness in terahertz time-domain spectroscopy

Withawat Withayachumnankul; John F. O'Hara; Wei Cao; Ibraheem Al-Naib; Weili Zhang

doi:10.1109/IRMMW-THz.2014.6956030

Lower bound of sample thickness in terahertz time-domain spectroscopy

Withawat Withayachumnankul, John F. O'Hara, Wei Cao, Ibraheem Al-Naib, Weili Zhang

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

Dielectric films with a thickness much less than a wavelength pose a challenge in transmission-mode terahertz time-domain spectroscopy (THz-TDS). A small signal change induced by such films is likely to be obscured by system uncertainties. In this abstract, several possible thin-film measurement procedures are carefully considered. It is found that an alternating sample and reference measurement approach is most sensitive for thin-film sensing. Importantly, a closed-form equation is developed to determine a lower bound of sample thickness as a function of the refractive index and system uncertainties. An experimental validation shows that typical THz-TDS can detect polymer films with a thickness of a few microns. The given criterion can be used to evaluate the system performance with respect to thin-film sensing.

Original language	English
Title of host publication	2014 39th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2014
Publisher	IEEE Computer Society
ISBN (Electronic)	9781479938773
DOIs	https://doi.org/10.1109/IRMMW-THz.2014.6956030
State	Published - 13 Nov 2014
Externally published	Yes
Event	39th International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2014 - Tucson, United States Duration: 14 Sep 2014 → 19 Sep 2014

Publication series

Name	International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
ISSN (Print)	2162-2027
ISSN (Electronic)	2162-2035

Conference

Conference	39th International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2014
Country/Territory	United States
City	Tucson
Period	14/09/14 → 19/09/14

Bibliographical note

Publisher Copyright:
© 2014 IEEE.

ASJC Scopus subject areas

Energy Engineering and Power Technology
Electrical and Electronic Engineering

Access to Document

10.1109/IRMMW-THz.2014.6956030

Cite this

Withayachumnankul, W., O'Hara, J. F., Cao, W., Al-Naib, I., & Zhang, W. (2014). Lower bound of sample thickness in terahertz time-domain spectroscopy. In 2014 39th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2014 Article 6956030 (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz). IEEE Computer Society. https://doi.org/10.1109/IRMMW-THz.2014.6956030

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title = "Lower bound of sample thickness in terahertz time-domain spectroscopy",

abstract = "Dielectric films with a thickness much less than a wavelength pose a challenge in transmission-mode terahertz time-domain spectroscopy (THz-TDS). A small signal change induced by such films is likely to be obscured by system uncertainties. In this abstract, several possible thin-film measurement procedures are carefully considered. It is found that an alternating sample and reference measurement approach is most sensitive for thin-film sensing. Importantly, a closed-form equation is developed to determine a lower bound of sample thickness as a function of the refractive index and system uncertainties. An experimental validation shows that typical THz-TDS can detect polymer films with a thickness of a few microns. The given criterion can be used to evaluate the system performance with respect to thin-film sensing.",

author = "Withawat Withayachumnankul and O'Hara, \{John F.\} and Wei Cao and Ibraheem Al-Naib and Weili Zhang",

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Withayachumnankul, W, O'Hara, JF, Cao, W, Al-Naib, I & Zhang, W 2014, Lower bound of sample thickness in terahertz time-domain spectroscopy. in 2014 39th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2014., 6956030, International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz, IEEE Computer Society, 39th International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2014, Tucson, United States, 14/09/14. https://doi.org/10.1109/IRMMW-THz.2014.6956030

Lower bound of sample thickness in terahertz time-domain spectroscopy. / Withayachumnankul, Withawat; O'Hara, John F.; Cao, Wei et al.
2014 39th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2014. IEEE Computer Society, 2014. 6956030 (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Lower bound of sample thickness in terahertz time-domain spectroscopy

AU - Withayachumnankul, Withawat

AU - O'Hara, John F.

AU - Cao, Wei

AU - Al-Naib, Ibraheem

AU - Zhang, Weili

PY - 2014/11/13

Y1 - 2014/11/13

N2 - Dielectric films with a thickness much less than a wavelength pose a challenge in transmission-mode terahertz time-domain spectroscopy (THz-TDS). A small signal change induced by such films is likely to be obscured by system uncertainties. In this abstract, several possible thin-film measurement procedures are carefully considered. It is found that an alternating sample and reference measurement approach is most sensitive for thin-film sensing. Importantly, a closed-form equation is developed to determine a lower bound of sample thickness as a function of the refractive index and system uncertainties. An experimental validation shows that typical THz-TDS can detect polymer films with a thickness of a few microns. The given criterion can be used to evaluate the system performance with respect to thin-film sensing.

AB - Dielectric films with a thickness much less than a wavelength pose a challenge in transmission-mode terahertz time-domain spectroscopy (THz-TDS). A small signal change induced by such films is likely to be obscured by system uncertainties. In this abstract, several possible thin-film measurement procedures are carefully considered. It is found that an alternating sample and reference measurement approach is most sensitive for thin-film sensing. Importantly, a closed-form equation is developed to determine a lower bound of sample thickness as a function of the refractive index and system uncertainties. An experimental validation shows that typical THz-TDS can detect polymer films with a thickness of a few microns. The given criterion can be used to evaluate the system performance with respect to thin-film sensing.

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Withayachumnankul W, O'Hara JF, Cao W, Al-Naib I, Zhang W. Lower bound of sample thickness in terahertz time-domain spectroscopy. In 2014 39th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2014. IEEE Computer Society. 2014. 6956030. (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz). doi: 10.1109/IRMMW-THz.2014.6956030

Lower bound of sample thickness in terahertz time-domain spectroscopy

Abstract

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Bibliographical note

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