Abstract
A SPICE model of metal oxide based resistive random access memory (RRAM) devices is demonstrated in this paper having bipolar switching characteristics and utilizing carbon nanotube field effect transistor (CNTFET) in a 1T1R configuration. The growth and the dissolution of the conductive filament in the oxide layer is the basis of the switching mechanism in this model. The model has been implemented in HSPICE simulation software for circuit level analysis. Initially, the simulation of memory cell with CNTFETs is carried out and later on 3∗3 memory matrix is analyzed. The proposed design shows a reduction in power consumption as compared to RRAM cell utilizing metal oxide semiconductor field effect transistor (MOSFET) in a 1T1R configuration.
| Original language | English |
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| Title of host publication | 2019 IEEE Student Conference on Research and Development, SCOReD 2019 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 280-283 |
| Number of pages | 4 |
| ISBN (Electronic) | 9781728126135 |
| DOIs | |
| State | Published - Oct 2019 |
| Externally published | Yes |
Publication series
| Name | 2019 IEEE Student Conference on Research and Development, SCOReD 2019 |
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Bibliographical note
Publisher Copyright:© 2019 IEEE.
Keywords
- Power dissipation
- RRAM
- emerging memory technology
- memory cell
- non-volatile memory
ASJC Scopus subject areas
- Computer Networks and Communications
- Computer Science Applications
- Aerospace Engineering
- Automotive Engineering
- Mechanical Engineering
- Computational Mathematics
- Safety, Risk, Reliability and Quality
- Instrumentation