Linear and nonlinear optical properties of SnS thermally evaporated thin films

A. S. Salwa; A. Salem

doi:10.1016/j.ijleo.2019.163140

Linear and nonlinear optical properties of SnS thermally evaporated thin films

A. S. Salwa, A. Salem^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

Thickness relying on linear and nonlinear optical properties of tin sulfide thin films has been studied. Tin sulfide thin films were grown utilizing thermal evaporation technique. SnS films have polycrystalline nature with orthorhombic structure shown from X-ray diffraction study. Transmission and reflection spectrum has been taken utilizing VIS-NIR spectrophotometer in the wavelength range 300–1100 nm. Linear optical properties of thin films indicate let direct and indirect transition type and the band gap increased with film thickness. The third order nonlinear optical susceptibility χ³ and nonlinear refractive index n₂ has been determined by mathematical calculation.

Original language	English
Article number	163140
Journal	Optik
Volume	196
DOIs	https://doi.org/10.1016/j.ijleo.2019.163140
State	Published - Nov 2019
Externally published	Yes

Bibliographical note

Publisher Copyright:
© 2019 Elsevier GmbH

Keywords

71.20.Nr
78.20.−e
Absorption coefficient
Direct energy gap
Linear optical susceptibility
Nonlinear refractive index
Optical characteristics of SnS
Thermal evaporated thin films

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering

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10.1016/j.ijleo.2019.163140

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title = "Linear and nonlinear optical properties of SnS thermally evaporated thin films",

abstract = "Thickness relying on linear and nonlinear optical properties of tin sulfide thin films has been studied. Tin sulfide thin films were grown utilizing thermal evaporation technique. SnS films have polycrystalline nature with orthorhombic structure shown from X-ray diffraction study. Transmission and reflection spectrum has been taken utilizing VIS-NIR spectrophotometer in the wavelength range 300–1100 nm. Linear optical properties of thin films indicate let direct and indirect transition type and the band gap increased with film thickness. The third order nonlinear optical susceptibility χ3 and nonlinear refractive index n2 has been determined by mathematical calculation.",

keywords = "71.20.Nr, 78.20.−e, Absorption coefficient, Direct energy gap, Linear optical susceptibility, Nonlinear refractive index, Optical characteristics of SnS, Thermal evaporated thin films",

author = "Salwa, \{A. S.\} and A. Salem",

note = "Publisher Copyright: {\textcopyright} 2019 Elsevier GmbH",

year = "2019",

month = nov,

doi = "10.1016/j.ijleo.2019.163140",

language = "English",

volume = "196",

journal = "Optik",

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T1 - Linear and nonlinear optical properties of SnS thermally evaporated thin films

AU - Salwa, A. S.

AU - Salem, A.

PY - 2019/11

Y1 - 2019/11

N2 - Thickness relying on linear and nonlinear optical properties of tin sulfide thin films has been studied. Tin sulfide thin films were grown utilizing thermal evaporation technique. SnS films have polycrystalline nature with orthorhombic structure shown from X-ray diffraction study. Transmission and reflection spectrum has been taken utilizing VIS-NIR spectrophotometer in the wavelength range 300–1100 nm. Linear optical properties of thin films indicate let direct and indirect transition type and the band gap increased with film thickness. The third order nonlinear optical susceptibility χ3 and nonlinear refractive index n2 has been determined by mathematical calculation.

AB - Thickness relying on linear and nonlinear optical properties of tin sulfide thin films has been studied. Tin sulfide thin films were grown utilizing thermal evaporation technique. SnS films have polycrystalline nature with orthorhombic structure shown from X-ray diffraction study. Transmission and reflection spectrum has been taken utilizing VIS-NIR spectrophotometer in the wavelength range 300–1100 nm. Linear optical properties of thin films indicate let direct and indirect transition type and the band gap increased with film thickness. The third order nonlinear optical susceptibility χ3 and nonlinear refractive index n2 has been determined by mathematical calculation.

KW - 71.20.Nr

KW - 78.20.−e

KW - Absorption coefficient

KW - Direct energy gap

KW - Linear optical susceptibility

KW - Nonlinear refractive index

KW - Optical characteristics of SnS

KW - Thermal evaporated thin films

UR - https://www.scopus.com/pages/publications/85070248193

U2 - 10.1016/j.ijleo.2019.163140

DO - 10.1016/j.ijleo.2019.163140

M3 - Article

AN - SCOPUS:85070248193

SN - 0030-4026

VL - 196

JO - Optik

JF - Optik

M1 - 163140

ER -

Linear and nonlinear optical properties of SnS thermally evaporated thin films

Abstract

Bibliographical note

Keywords

ASJC Scopus subject areas

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