Abstract
Transmission lines are susceptible to a variety of phenomena that can cause system faults. The most prevalent cause of faults in the power system is lightning strikes, while other causes may include insulator failure, tree or crane encroachment. In this study, two machine learning algorithms, Support Vector Machine (SVM) and k-Nearest Neighbor (kNN), were used and compared to classify faults due to lightning strikes, insulator failure, tree and crane encroachment. The input variables for the models were based on the root mean square (RMS) current duration, voltage dip, and energy wavelet measured at the sending end of a line. The proposed method was implemented in the MATLAB/SIMULINK programming platform. The classification performance of the developed algorithms was evaluated using confusion matrix. Overall, SVM algorithm performed better than k-NN in terms of classification accuracy, achieving a value of 97.10% compared to k-NN's 70.60%. Moreover, SVM also outperformed k-NN in terms of computational time, with time taken by SVM is 3.63 s compared to 10.06 s by k-NN.
| Original language | English |
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| Title of host publication | APL 2023 - 12th Asia-Pacific International Conference on Lightning |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (Electronic) | 9781665456852 |
| DOIs | |
| State | Published - 2023 |
| Externally published | Yes |
| Event | 12th Asia-Pacific International Conference on Lightning, APL 2023 - Langkawi, Malaysia Duration: 12 Jun 2023 → 15 Jun 2023 |
Publication series
| Name | APL 2023 - 12th Asia-Pacific International Conference on Lightning |
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Conference
| Conference | 12th Asia-Pacific International Conference on Lightning, APL 2023 |
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| Country/Territory | Malaysia |
| City | Langkawi |
| Period | 12/06/23 → 15/06/23 |
Bibliographical note
Publisher Copyright:© 2023 IEEE.
Keywords
- Support Vector Machine (SVM)
- accuracy
- computational time
- k-Nearest Neighbor (k-NN)
- lightning fault
ASJC Scopus subject areas
- Safety, Risk, Reliability and Quality
- Electronic, Optical and Magnetic Materials
- Atmospheric Science
- Electrical and Electronic Engineering