Lifetimes of organic photovoltaics: Combining chemical and physical characterisation techniques to study degradation mechanisms

K. Norrman*, N. B. Larsen, F. C. Krebs

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

171 Scopus citations

Abstract

Degradation mechanisms of a photovoltaic device with an Al/C60/C12-PSV/PEDOT:PSS/ITO/glass geometry was studied using a combination of in-plane physical and chemical analysis techniques: TOF-SIMS, AFM, SEM, interference microscopy and fluorescence microscopy. A comparison was made between a device being stored in darkness in air and a device that had been subjected to illumination under simulated sunlight (1000 W m-2, AM1.5) in air. It was found that oxygen diffuses through pinholes in the aluminium electrode. If stored in air in the dark the oxidation is limited to the C60 layer. Illumination accelerates the oxidation/degradation and thus expands the process to involve at least the underlying layer of C12-PSV. Furthermore, it was found that particles are formed in the device during storage.

Original languageEnglish
Pages (from-to)2793-2814
Number of pages22
JournalSolar Energy Materials and Solar Cells
Volume90
Issue number17
DOIs
StatePublished - 6 Nov 2006
Externally publishedYes

Bibliographical note

Funding Information:
This work was supported by the Danish Technical Research Council (STVF 26-02-0174, STVF 2058-03-0016, STVF 26-04-0073), the Danish Strategic Research Council (DSF 2104-04-0030) and Public Service Obligation (PSO 103032 FU 3301).

Keywords

  • AFM
  • Degradation
  • Fluorescence microscopy
  • Interference microscopy
  • Lifetime
  • Organic photovoltaics
  • Oxygen isotopic labelling
  • PEDOT:PSS
  • PSS
  • Photo-oxidation
  • Polymer photovoltaics
  • SEM
  • TOF-SIMS

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Renewable Energy, Sustainability and the Environment
  • Surfaces, Coatings and Films

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