Abstract
Degradation mechanisms of a photovoltaic device with an Al/C60/C12-PSV/PEDOT:PSS/ITO/glass geometry was studied using a combination of in-plane physical and chemical analysis techniques: TOF-SIMS, AFM, SEM, interference microscopy and fluorescence microscopy. A comparison was made between a device being stored in darkness in air and a device that had been subjected to illumination under simulated sunlight (1000 W m-2, AM1.5) in air. It was found that oxygen diffuses through pinholes in the aluminium electrode. If stored in air in the dark the oxidation is limited to the C60 layer. Illumination accelerates the oxidation/degradation and thus expands the process to involve at least the underlying layer of C12-PSV. Furthermore, it was found that particles are formed in the device during storage.
| Original language | English |
|---|---|
| Pages (from-to) | 2793-2814 |
| Number of pages | 22 |
| Journal | Solar Energy Materials and Solar Cells |
| Volume | 90 |
| Issue number | 17 |
| DOIs | |
| State | Published - 6 Nov 2006 |
| Externally published | Yes |
Bibliographical note
Funding Information:This work was supported by the Danish Technical Research Council (STVF 26-02-0174, STVF 2058-03-0016, STVF 26-04-0073), the Danish Strategic Research Council (DSF 2104-04-0030) and Public Service Obligation (PSO 103032 FU 3301).
Keywords
- AFM
- Degradation
- Fluorescence microscopy
- Interference microscopy
- Lifetime
- Organic photovoltaics
- Oxygen isotopic labelling
- PEDOT:PSS
- PSS
- Photo-oxidation
- Polymer photovoltaics
- SEM
- TOF-SIMS
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Renewable Energy, Sustainability and the Environment
- Surfaces, Coatings and Films