IoT for health and usage monitoring systems: Mitigating consequences in manufacturing under CBM

Samir Mekid*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

Interactivities between devices using network technologies form Internet of Things (IoT) is of interest to Manufacturing. IoT is the advanced technology that is useful for condition-based monitoring of systems, more known as Health and Usage Monitoring Systems (HUMS). These all are inscribed under e-maintenance and more recently under I4.0 Maintenance. An IoT-based condition monitoring solution is designed to predict potential damage by collecting large data and applying true prognostics in the cloud server. The paper describes features needed in the IoT used in the manufacturing. Example of monitored wear using sensors attached to insert of cutting tool are discussed along with HUMS structural application. For simplicity, the IoT will be connected to the Thingspeak Cloud for the data processing with the help of Wi-Fi based microcontroller. The entire system can be used for easy evaluation of the collected data. The proposed system experimental values are reliable, user friendly and economical.

Original languageEnglish
Title of host publication18th IEEE International Multi-Conference on Systems, Signals and Devices, SSD 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages569-574
Number of pages6
ISBN (Electronic)9781665414937
DOIs
StatePublished - 22 Mar 2021

Publication series

Name18th IEEE International Multi-Conference on Systems, Signals and Devices, SSD 2021

Bibliographical note

Publisher Copyright:
© 2021 IEEE.

Keywords

  • HUMS
  • Health and usage monitoring systems
  • Internet of things
  • IoT
  • maintenance
  • structural health monitoring

ASJC Scopus subject areas

  • Artificial Intelligence
  • Computer Networks and Communications
  • Computer Science Applications
  • Signal Processing
  • Electrical and Electronic Engineering

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