Influence of germanium incorporation on the structural and electrical properties of boron-doped ultrathin poly-Si1-x Ge x films deposited by chemical vapour deposition

T. B. Asafa*, A. Witvrouw, B. S. Morcos, K. Vanstreels, S. A.M. Said

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

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