In situ characterization of halide perovskite synthesis

Maged Abdelsamie*, Tim Kodalle, Mriganka Singh, Carolin M. Sutter-Fella

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

Abstract

This chapter describes the application of in situ characterization to the fabrication of halide perovskite thin films to understand formation pathways and gain mechanistic insights into thermodynamically and kinetically driven processes during formation. The main techniques discussed are in situ X-ray and optical spectroscopy characterization.

Original languageEnglish
Title of host publicationHalide Perovskite Semiconductors
Subtitle of host publicationStructures, Characterization, Properties, and Phenomena
PublisherWiley-Blackwell
Pages411-441
Number of pages31
ISBN (Electronic)9783527829026
ISBN (Print)9783527348091
DOIs
StatePublished - 15 Dec 2023

Bibliographical note

Publisher Copyright:
© 2024 WILEY-VCH GmbH, Boschstrasse 12, 69469 Weinheim, Germany. All rights reserved.

Keywords

  • Absorption spectroscopy
  • Crystallization kinetics
  • Halide perovskites
  • In situ characterization
  • Multimodal
  • Optical properties
  • Photoluminescence
  • Reflectometry
  • Synchrotron X-ray

ASJC Scopus subject areas

  • General Chemistry

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