Abstract
This chapter describes the application of in situ characterization to the fabrication of halide perovskite thin films to understand formation pathways and gain mechanistic insights into thermodynamically and kinetically driven processes during formation. The main techniques discussed are in situ X-ray and optical spectroscopy characterization.
Original language | English |
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Title of host publication | Halide Perovskite Semiconductors |
Subtitle of host publication | Structures, Characterization, Properties, and Phenomena |
Publisher | Wiley-Blackwell |
Pages | 411-441 |
Number of pages | 31 |
ISBN (Electronic) | 9783527829026 |
ISBN (Print) | 9783527348091 |
DOIs | |
State | Published - 15 Dec 2023 |
Bibliographical note
Publisher Copyright:© 2024 WILEY-VCH GmbH, Boschstrasse 12, 69469 Weinheim, Germany. All rights reserved.
Keywords
- Absorption spectroscopy
- Crystallization kinetics
- Halide perovskites
- In situ characterization
- Multimodal
- Optical properties
- Photoluminescence
- Reflectometry
- Synchrotron X-ray
ASJC Scopus subject areas
- General Chemistry