Hopping contribution to tunneling in NIS junction

Research output: Contribution to journalArticlepeer-review

Abstract

The hopping contribution to the current-voltage characteristic (I-V) of a NIS amorphous tunnel junction containing two impurity localized states in the barrier region is studied using the kinetic equation approach. It is found that the non-linear behavior of the I-V characteristic depends strongly on temperature.

Original languageEnglish
Pages (from-to)210-214
Number of pages5
JournalPhysics Letters, Section A: General, Atomic and Solid State Physics
Volume194
Issue number3
DOIs
StatePublished - 31 Oct 1994

ASJC Scopus subject areas

  • General Physics and Astronomy

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