High-impedance fault diagnosis: A review

Abdulaziz Aljohani*, Ibrahim Habiballah

*Corresponding author for this work

Research output: Contribution to journalReview articlepeer-review

48 Scopus citations

Abstract

High-impedance faults (HIFs) represent one of the biggest challenges in power distribution networks. An HIF occurs when an electrical conductor unintentionally comes into contact with a highly resistive medium, resulting in a fault current lower than 75 amperes in medium-voltage circuits. Under such condition, the fault current is relatively close in value to the normal drawn ampere from the load, resulting in a condition of blindness towards HIFs by conventional overcurrent relays. This paper intends to review the literature related to the HIF phenomenon including models and characteristics. In this work, detection, classification, and location methodologies are reviewed. In addition, diagnosis techniques are categorized, evaluated, and compared with one another. Finally, disadvantages of current approaches and a look ahead to the future of fault diagnosis are discussed.

Original languageEnglish
Article number6447
JournalEnergies
Volume13
Issue number23
DOIs
StatePublished - Dec 2020

Bibliographical note

Publisher Copyright:
© 2020 by the authors. Licensee MDPI, Basel, Switzerland.

Keywords

  • Artificial neural networks
  • Fault detection techniques
  • Fault location techniques
  • High-impedance fault
  • Machine learning
  • Modeling
  • Signal processing
  • Stockwell transform
  • Wavelet transform

ASJC Scopus subject areas

  • Renewable Energy, Sustainability and the Environment
  • Energy Engineering and Power Technology
  • Energy (miscellaneous)
  • Control and Optimization
  • Electrical and Electronic Engineering

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