Abstract
A new method is presented for predicting the harmonic and intermodulation performance of a SOI FD MOSFET transistor operating, in its triode regime, as a resistor. The results show that, for the same order, the intermodulation product is dominant. This suggests that the use of intermodulation distortion measurement is more informative and relevant than the use of total-harmonic distortion.
| Original language | English |
|---|---|
| Pages (from-to) | 797-800 |
| Number of pages | 4 |
| Journal | Solid-State Electronics |
| Volume | 47 |
| Issue number | 5 |
| DOIs | |
| State | Published - May 2003 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry
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