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Full-duplex relaying systems subject to co-channel interference and noise in Nakagami-m fading

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

14 Scopus citations

Abstract

This paper investigates the performance of dual-hop full-duplex relaying schemes subject to co-channel interference (CCI) and noise. In our analysis, two main scenarios are considered: in the first scenario, the link between the source and destination is seen as interference and, in the second one, it is seen as useful information. In both schemes, the effect of self-interference at the relay is taken into account. Accurate, closed- form expressions for the outage probability are derived for the general case, in which CCI and noise are assumed at both the relay and destination. The derived expressions allow for independent non-identically distributed Nakagami-m fading. Based on these expressions, special cases (but, yet new) assuming CCI only at the relay and assuming CCI only at the destination are examined. It is shown that CCI at the relay is more harmful for the system performance than CCI at the destination.

Original languageEnglish
Title of host publication2015 IEEE 81st Vehicular Technology Conference, VTC Spring 2015 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479980888
DOIs
StatePublished - 1 Jul 2015
Externally publishedYes
Event81st IEEE Vehicular Technology Conference, VTC 2015-Spring - Glasgow, United Kingdom
Duration: 11 May 2015 → 14 May 2015

Publication series

NameIEEE Vehicular Technology Conference
Volume2015
ISSN (Print)1090-3038

Conference

Conference81st IEEE Vehicular Technology Conference, VTC 2015-Spring
Country/TerritoryUnited Kingdom
CityGlasgow
Period11/05/15 → 14/05/15

Bibliographical note

Publisher Copyright:
© 2015 IEEE.

Keywords

  • Co-channel interference
  • Cooperative systems
  • Full-duplex relaying
  • Nakagami-m fading
  • Performance analysis

ASJC Scopus subject areas

  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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