Fretting studies of nanocrystalline Pd, Pd-Ag and Pd-Y films

M. L. Trudeau; M. Braunovic; K. J. Bryden; J. Y. Ying

Fretting studies of nanocrystalline Pd, Pd-Ag and Pd-Y films

M. L. Trudeau^*, M. Braunovic, K. J. Bryden, J. Y. Ying

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Abstract

In the present work, the effects of fretting on the contact resistance behavior of nanocrystalline Pd, Pd₉₀Y₁₀ and Pd₆₀Ag₄₀ films deposited on phosphorus-nickel and phosphorus-bronze plates was investigated. The wires used were bare copper, tin-plated copper and silver-copper (Ag₉₀Cu₁₀). Some of the wires were also coated with the same nanostructured films. The contact resistance was used to monitor the interaction between the wires and the plates. Following the fretting experiments, the surface of the contact regions was examined using scanning electron microscopy with energy dispersive x-ray detection and by Auger spectroscopy. The microstructure of the different films, as well as the effect of thermal of the film/plate combination were investigated. This study shows that nanostructured films have a large technological potential in the improvement of low current electrical connections.

Original language	English
Pages (from-to)	383-394
Number of pages	12
Journal	Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts
State	Published - 1996
Externally published	Yes
Event	Proceedings of the 1996 42nd IEEE Holm Conference on Electrical Contacts Joint with the 18th International Conference on Electrical Contacts - Chicago, IL, USA Duration: 16 Sep 1996 → 20 Sep 1996

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Cite this

@article{1832045ba9d5414a90c6c7543e4f0bfd,

title = "Fretting studies of nanocrystalline Pd, Pd-Ag and Pd-Y films",

abstract = "In the present work, the effects of fretting on the contact resistance behavior of nanocrystalline Pd, Pd90Y10 and Pd60Ag40 films deposited on phosphorus-nickel and phosphorus-bronze plates was investigated. The wires used were bare copper, tin-plated copper and silver-copper (Ag90Cu10). Some of the wires were also coated with the same nanostructured films. The contact resistance was used to monitor the interaction between the wires and the plates. Following the fretting experiments, the surface of the contact regions was examined using scanning electron microscopy with energy dispersive x-ray detection and by Auger spectroscopy. The microstructure of the different films, as well as the effect of thermal of the film/plate combination were investigated. This study shows that nanostructured films have a large technological potential in the improvement of low current electrical connections.",

author = "Trudeau, \{M. L.\} and M. Braunovic and Bryden, \{K. J.\} and Ying, \{J. Y.\}",

year = "1996",

language = "English",

pages = "383--394",

journal = "Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts",

issn = "0361-4395",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "Proceedings of the 1996 42nd IEEE Holm Conference on Electrical Contacts Joint with the 18th International Conference on Electrical Contacts ; Conference date: 16-09-1996 Through 20-09-1996",

}

TY - JOUR

T1 - Fretting studies of nanocrystalline Pd, Pd-Ag and Pd-Y films

AU - Trudeau, M. L.

AU - Braunovic, M.

AU - Bryden, K. J.

AU - Ying, J. Y.

PY - 1996

Y1 - 1996

N2 - In the present work, the effects of fretting on the contact resistance behavior of nanocrystalline Pd, Pd90Y10 and Pd60Ag40 films deposited on phosphorus-nickel and phosphorus-bronze plates was investigated. The wires used were bare copper, tin-plated copper and silver-copper (Ag90Cu10). Some of the wires were also coated with the same nanostructured films. The contact resistance was used to monitor the interaction between the wires and the plates. Following the fretting experiments, the surface of the contact regions was examined using scanning electron microscopy with energy dispersive x-ray detection and by Auger spectroscopy. The microstructure of the different films, as well as the effect of thermal of the film/plate combination were investigated. This study shows that nanostructured films have a large technological potential in the improvement of low current electrical connections.

AB - In the present work, the effects of fretting on the contact resistance behavior of nanocrystalline Pd, Pd90Y10 and Pd60Ag40 films deposited on phosphorus-nickel and phosphorus-bronze plates was investigated. The wires used were bare copper, tin-plated copper and silver-copper (Ag90Cu10). Some of the wires were also coated with the same nanostructured films. The contact resistance was used to monitor the interaction between the wires and the plates. Following the fretting experiments, the surface of the contact regions was examined using scanning electron microscopy with energy dispersive x-ray detection and by Auger spectroscopy. The microstructure of the different films, as well as the effect of thermal of the film/plate combination were investigated. This study shows that nanostructured films have a large technological potential in the improvement of low current electrical connections.

UR - https://www.scopus.com/pages/publications/0029726308

M3 - Conference article

AN - SCOPUS:0029726308

SN - 0361-4395

SP - 383

EP - 394

JO - Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts

JF - Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts

T2 - Proceedings of the 1996 42nd IEEE Holm Conference on Electrical Contacts Joint with the 18th International Conference on Electrical Contacts

Y2 - 16 September 1996 through 20 September 1996

ER -

Fretting studies of nanocrystalline Pd, Pd-Ag and Pd-Y films

Abstract

ASJC Scopus subject areas

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