TY - GEN
T1 - Force response of single living cells due to localized deformation
AU - Saif, T.
AU - Sager, C.
AU - Coyer, S.
PY - 2002
Y1 - 2002
N2 - We present a method for measuring the mechanical response of a single cell in-situ when local deformation is applied at an adhesion site(s) by a functionalized MEMS (Micro Electro Mechanical Systems) force sensor with pN - nN force resolution, and with force and displacement ranges of 100s of nNs and μms. The force sensor is a micro mechanical cantilever beam made of single crystal silicon (SCS), coated by a thin layer of Fibronectin, an extra cellular matrix (ECM) protein, to activate cell adhesion. The end of the beam is brought in contact with a cell to form the adhesion site(s). The cantilever is then moved away from the cell to locally deform it. The force on the cell is measured from the deformation of the cantilever until the adhesion sites fails. We demonstrate the method by deforming several endothelial and fibroblast cells. Force response of the fibroblast cell shows linear behavior.
AB - We present a method for measuring the mechanical response of a single cell in-situ when local deformation is applied at an adhesion site(s) by a functionalized MEMS (Micro Electro Mechanical Systems) force sensor with pN - nN force resolution, and with force and displacement ranges of 100s of nNs and μms. The force sensor is a micro mechanical cantilever beam made of single crystal silicon (SCS), coated by a thin layer of Fibronectin, an extra cellular matrix (ECM) protein, to activate cell adhesion. The end of the beam is brought in contact with a cell to form the adhesion site(s). The cantilever is then moved away from the cell to locally deform it. The force on the cell is measured from the deformation of the cantilever until the adhesion sites fails. We demonstrate the method by deforming several endothelial and fibroblast cells. Force response of the fibroblast cell shows linear behavior.
UR - https://www.scopus.com/pages/publications/78249273981
M3 - Conference contribution
AN - SCOPUS:78249273981
SN - 0791836428
SN - 9780791836422
T3 - ASME International Mechanical Engineering Congress and Exposition, Proceedings
SP - 591
EP - 593
BT - Microelectromechanical Systems
PB - American Society of Mechanical Engineers (ASME)
ER -