Abstract
With the emergence of the Internet of Things (IoT), flexible high-performance nanoscale electronics are more desired. At the moment, FinFET is the most advanced transistor architecture used in the state-of-the-art microprocessors. Therefore, we show a soft-etch based substrate thinning process to transform silicon-on-insulator (SOI) based nanoscale FinFET into flexible FinFET and then conduct comprehensive electrical characterization under various bending conditions to understand its electrical performance. Our study shows that back-etch based substrate thinning process is gentler than traditional abrasive back-grinding process; it can attain ultraflexibility and the electrical characteristics of the flexible nanoscale FinFET show no performance degradation compared to its rigid bulk counterpart indicating its readiness to be used for flexible high-performance electronics.
Original language | English |
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Pages (from-to) | 9850-9856 |
Number of pages | 7 |
Journal | ACS Nano |
Volume | 8 |
Issue number | 10 |
DOIs | |
State | Published - 28 Oct 2014 |
Externally published | Yes |
Bibliographical note
Publisher Copyright:© 2014 American Chemical Society.
Keywords
- FinFETs
- flexible silicon
- high-performance flexible electronics
ASJC Scopus subject areas
- General Materials Science
- General Engineering
- General Physics and Astronomy