Abstract
Implementation of memory on bendable substrates is an important step toward a complete and fully developed notion of mechanically flexible computational systems. In this paper, we have demonstrated a simple fabrication flow to build metal-insulator-metal capacitors, key components of dynamic random access memory, on a mechanically flexible silicon (100) fabric. We rely on standard microfabrication processes to release a thin sheet of bendable silicon (area: 18 {\rm cm}2 and thickness: 25 \mu{\rm m}) in an inexpensive and reliable way. On such platform, we fabricated and characterized the devices showing mechanical robustness (minimum bending radius of 10 mm at an applied strain of 83.33% and nominal strain of 0.125%) and consistent electrical behavior regardless of the applied mechanical stress. Furthermore, and for the first time, we performed a reliability study suggesting no significant difference in performance and showing an improvement in lifetime projections.
Original language | English |
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Article number | 6587134 |
Pages (from-to) | 3305-3309 |
Number of pages | 5 |
Journal | IEEE Transactions on Electron Devices |
Volume | 60 |
Issue number | 10 |
DOIs | |
State | Published - 2013 |
Externally published | Yes |
Keywords
- Bending curvature
- flexible
- high k
- metal gate
- metal-insulator-metal capacitors (MIMCAPs)
- silicon (100)
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering