Feature Extraction Techniques from Contaminated-Insulator Leakage Current Data for Deep Learning Applications in Condition Monitoring of High Voltage Insulators

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

This paper presents advanced feature extraction techniques for analyzing leakage current data from contaminated high voltage insulators, aimed at enhancing deep learning applications in condition monitoring. We extract and evaluate time-domain, frequency-domain, and wavelet domain features from leakage current signals. Using Random Forest and permutation importance, we identify key features such as temperature, relative humidity, peak-to-peak values, wavelet energy, and spectral centroid. Correlation and scatter matrix visualizations illustrate the relationships between features and their ability to distinguish pollution levels. A careful selection of features facilitates efficient training of deep learning algorithms to generalize across various contamination levels and environmental conditions.

Original languageEnglish
Title of host publication2024 10th International Conference on Condition Monitoring and Diagnosis, CMD 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages608-611
Number of pages4
ISBN (Electronic)9788986510225
DOIs
StatePublished - 2024
Event10th International Conference on Condition Monitoring and Diagnosis, CMD 2024 - Gangneung, Korea, Republic of
Duration: 20 Oct 202424 Oct 2024

Publication series

Name2024 10th International Conference on Condition Monitoring and Diagnosis, CMD 2024

Conference

Conference10th International Conference on Condition Monitoring and Diagnosis, CMD 2024
Country/TerritoryKorea, Republic of
CityGangneung
Period20/10/2424/10/24

Bibliographical note

Publisher Copyright:
© 2024 The Korean Institute of Electrical Engineers (KIEE).

Keywords

  • Condition Monitoring
  • Deep Learning
  • Frequency-Domain Features
  • High Voltage Insulators
  • Leakage Current
  • Permutation Importance
  • Random Forest
  • Wavelet Features

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Safety, Risk, Reliability and Quality

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