@inproceedings{15b1703a1eb14545b77385f0afd75fb8,
title = "Extended frequency-directed run-length code with improved application to System-on-a-chip test data compression",
abstract = "One of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data size. To reduce the volume of test data, several test data compression techniques have been proposed. Frequency-directed run-length (FDR) code is a variable-to-variable run length code based on encoding runs of O's. In this work, we demonstrate that higher test data compression can be achieved based on encoding both runs of 0 's and 1 's. We propose an extension to the FDR code and demonstrate by experimental results its effectiveness in achieving higher compression ratio.",
author = "El-Maleh, \{Aiman H.\} and Al-Abaji, \{Raslan H.\}",
year = "2002",
doi = "10.1109/ICECS.2002.1046192",
language = "English",
isbn = "0780375963",
series = "Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems",
pages = "449--452",
booktitle = "ICECS 2002 - 9th IEEE International Conference on Electronics, Circuits and Systems",
}