Exponential decay of local conductance in single-wall carbon nanotubes

M. Stadermann*, S. J. Papadakis, M. R. Falvo, Q. Fu, J. Liu, Y. Fridman, J. J. Boland, R. Superfine, S. Washburn

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

16 Scopus citations

Abstract

We have measured the decay of local conductance in single-wall carbon nanotubes directly using conductance imaging atomic force microscopy. The decay lengths were in the range from 190nm to well over 3μm. There are strong indications that these decay lengths are the result of depletion lengths around metallic/semiconducting carbon nanotube junctions, and that they are related to defects in the tubes.

Original languageEnglish
Article number245406
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume72
Issue number24
DOIs
StatePublished - 15 Dec 2005
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Fingerprint

Dive into the research topics of 'Exponential decay of local conductance in single-wall carbon nanotubes'. Together they form a unique fingerprint.

Cite this