Abstract
We have measured the decay of local conductance in single-wall carbon nanotubes directly using conductance imaging atomic force microscopy. The decay lengths were in the range from 190nm to well over 3μm. There are strong indications that these decay lengths are the result of depletion lengths around metallic/semiconducting carbon nanotube junctions, and that they are related to defects in the tubes.
| Original language | English |
|---|---|
| Article number | 245406 |
| Journal | Physical Review B - Condensed Matter and Materials Physics |
| Volume | 72 |
| Issue number | 24 |
| DOIs | |
| State | Published - 15 Dec 2005 |
| Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics