Experimental investigation of thermoelectric properties of Bi1-xSbx nanowire arrays

Yu Ming Lin; Oded Rabin; S. B. Cronin; J. Y. Ying; M. S. Dresselhaus

doi:10.1109/ICT.2002.1190312

Experimental investigation of thermoelectric properties of Bi_1-xSb_x nanowire arrays

Yu Ming Lin, Oded Rabin, S. B. Cronin, J. Y. Ying, M. S. Dresselhaus

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

Temperature-dependent resistance and Seebeck coefficient measurements were performed on Bi1-xSbx nanowire arrays with various wire diameters and Sb contents. The results showed enhanced thermopower and complex R(T) behavior due to the unique semimetal-to-semiconductor transition predicted for Bi-related nanowire systems. The agreement between theoretical calculations and experimental results not only supports the model we used, but also validates the promising thermoelectric properties predicted for Bi1-xSbx nanowire systems.

Original language	English
Title of host publication	Proceedings ICT 2002
Subtitle of host publication	21st International Conference on Thermoelectrics
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	253-256
Number of pages	4
ISBN (Electronic)	0780376838
DOIs	https://doi.org/10.1109/ICT.2002.1190312
State	Published - 2002
Externally published	Yes
Event	21st International Conference on Thermoelectrics, ICT 2002 - Long Beach, United States Duration: 25 Aug 2002 → 29 Aug 2002

Publication series

Name	International Conference on Thermoelectrics, ICT, Proceedings
Volume	2002-January

Conference

Conference	21st International Conference on Thermoelectrics, ICT 2002
Country/Territory	United States
City	Long Beach
Period	25/08/02 → 29/08/02

Bibliographical note

Publisher Copyright:
© 2002 IEEE.

ASJC Scopus subject areas

Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/ICT.2002.1190312

Cite this

Lin, Y. M., Rabin, O., Cronin, S. B., Ying, J. Y., & Dresselhaus, M. S. (2002). Experimental investigation of thermoelectric properties of Bi_1-xSb_x nanowire arrays. In Proceedings ICT 2002: 21st International Conference on Thermoelectrics (pp. 253-256). Article 1190312 (International Conference on Thermoelectrics, ICT, Proceedings; Vol. 2002-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICT.2002.1190312

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title = "Experimental investigation of thermoelectric properties of Bi1-xSbx nanowire arrays",

abstract = "Temperature-dependent resistance and Seebeck coefficient measurements were performed on Bi1-xSbx nanowire arrays with various wire diameters and Sb contents. The results showed enhanced thermopower and complex R(T) behavior due to the unique semimetal-to-semiconductor transition predicted for Bi-related nanowire systems. The agreement between theoretical calculations and experimental results not only supports the model we used, but also validates the promising thermoelectric properties predicted for Bi1-xSbx nanowire systems.",

author = "Lin, \{Yu Ming\} and Oded Rabin and Cronin, \{S. B.\} and Ying, \{J. Y.\} and Dresselhaus, \{M. S.\}",

note = "Publisher Copyright: {\textcopyright} 2002 IEEE.; 21st International Conference on Thermoelectrics, ICT 2002 ; Conference date: 25-08-2002 Through 29-08-2002",

year = "2002",

doi = "10.1109/ICT.2002.1190312",

language = "English",

series = "International Conference on Thermoelectrics, ICT, Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "253--256",

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Lin, YM, Rabin, O, Cronin, SB, Ying, JY & Dresselhaus, MS 2002, Experimental investigation of thermoelectric properties of Bi_1-xSb_x nanowire arrays. in Proceedings ICT 2002: 21st International Conference on Thermoelectrics., 1190312, International Conference on Thermoelectrics, ICT, Proceedings, vol. 2002-January, Institute of Electrical and Electronics Engineers Inc., pp. 253-256, 21st International Conference on Thermoelectrics, ICT 2002, Long Beach, United States, 25/08/02. https://doi.org/10.1109/ICT.2002.1190312

Experimental investigation of thermoelectric properties of Bi_1-xSb_x nanowire arrays. / Lin, Yu Ming; Rabin, Oded; Cronin, S. B. et al.
Proceedings ICT 2002: 21st International Conference on Thermoelectrics. Institute of Electrical and Electronics Engineers Inc., 2002. p. 253-256 1190312 (International Conference on Thermoelectrics, ICT, Proceedings; Vol. 2002-January).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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T1 - Experimental investigation of thermoelectric properties of Bi1-xSbx nanowire arrays

AU - Lin, Yu Ming

AU - Rabin, Oded

AU - Cronin, S. B.

AU - Ying, J. Y.

AU - Dresselhaus, M. S.

PY - 2002

Y1 - 2002

N2 - Temperature-dependent resistance and Seebeck coefficient measurements were performed on Bi1-xSbx nanowire arrays with various wire diameters and Sb contents. The results showed enhanced thermopower and complex R(T) behavior due to the unique semimetal-to-semiconductor transition predicted for Bi-related nanowire systems. The agreement between theoretical calculations and experimental results not only supports the model we used, but also validates the promising thermoelectric properties predicted for Bi1-xSbx nanowire systems.

AB - Temperature-dependent resistance and Seebeck coefficient measurements were performed on Bi1-xSbx nanowire arrays with various wire diameters and Sb contents. The results showed enhanced thermopower and complex R(T) behavior due to the unique semimetal-to-semiconductor transition predicted for Bi-related nanowire systems. The agreement between theoretical calculations and experimental results not only supports the model we used, but also validates the promising thermoelectric properties predicted for Bi1-xSbx nanowire systems.

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DO - 10.1109/ICT.2002.1190312

M3 - Conference contribution

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BT - Proceedings ICT 2002

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Lin YM, Rabin O, Cronin SB, Ying JY, Dresselhaus MS. Experimental investigation of thermoelectric properties of Bi_1-xSb_x nanowire arrays. In Proceedings ICT 2002: 21st International Conference on Thermoelectrics. Institute of Electrical and Electronics Engineers Inc. 2002. p. 253-256. 1190312. (International Conference on Thermoelectrics, ICT, Proceedings). doi: 10.1109/ICT.2002.1190312