Experimental Analysis of VNA-based Measurement Errors in Mobile THz Applications

Yamen Zantah; Aman Batra; Andreas Prokscha; Fawad Sheikh; Muhammad Haidar; Nidal Zarifeh; Ali Alhaj Abbas; Thomas Kaiser

doi:10.1109/IWMTS58186.2023.10207852

Experimental Analysis of VNA-based Measurement Errors in Mobile THz Applications

Yamen Zantah^*
, Aman Batra
, Andreas Prokscha
, Fawad Sheikh
, Muhammad Haidar
, Nidal Zarifeh
, Ali Alhaj Abbas
, Thomas Kaiser

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

4 Scopus citations

Abstract

Terahertz (THz) measurement systems are crucial for the performance validation and testing of innovative designs and components to verify their reliability towards designated THz applications. This paper investigates the measurement uncertainty of THz measurement setup based on Vector Network Analyzer (VNA) with frequency extension modules. Our work focuses on the effects of equipment mobility and the accompanying radio-frequency (RF) cable flexure, which impact phase stability and measurement accuracy. The stability of THz VNA system is studied for four VNA extension setups at waveguide frequency bands from 75 GHz up to 1.5 THz. The upper bound of phase error caused by RF cable flexure is determined up to 330 GHz. The influence of the considered uncertainty is demonstrated by a degradation in the range accuracy and distortion in the image quality of a 2-D THz imaging scenario.

Original language	English
Title of host publication	2023 6th International Workshop on Mobile Terahertz Systems, IWMTS 2023
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9798350321159
DOIs	https://doi.org/10.1109/IWMTS58186.2023.10207852
State	Published - 2023
Externally published	Yes
Event	6th International Workshop on Mobile Terahertz Systems, IWMTS 2023 - Bonn, Germany Duration: 3 Jul 2023 → 5 Jul 2023

Publication series

Name	2023 6th International Workshop on Mobile Terahertz Systems, IWMTS 2023

Conference

Conference	6th International Workshop on Mobile Terahertz Systems, IWMTS 2023
Country/Territory	Germany
City	Bonn
Period	3/07/23 → 5/07/23

Bibliographical note

Publisher Copyright:
© 2023 IEEE.

Keywords

SAR imaging
Terahertz
cable flexure
localization
measurement uncertainty
phase stability
vector network analyzer

ASJC Scopus subject areas

Computer Networks and Communications
Instrumentation
Radiation

Access to Document

10.1109/IWMTS58186.2023.10207852

Cite this

Zantah, Y., Batra, A., Prokscha, A., Sheikh, F., Haidar, M., Zarifeh, N., Abbas, A. A., & Kaiser, T. (2023). Experimental Analysis of VNA-based Measurement Errors in Mobile THz Applications. In 2023 6th International Workshop on Mobile Terahertz Systems, IWMTS 2023 (2023 6th International Workshop on Mobile Terahertz Systems, IWMTS 2023). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IWMTS58186.2023.10207852

@inproceedings{2ba1b2c3c0d04525865d4c243b8c0dfb,

title = "Experimental Analysis of VNA-based Measurement Errors in Mobile THz Applications",

abstract = "Terahertz (THz) measurement systems are crucial for the performance validation and testing of innovative designs and components to verify their reliability towards designated THz applications. This paper investigates the measurement uncertainty of THz measurement setup based on Vector Network Analyzer (VNA) with frequency extension modules. Our work focuses on the effects of equipment mobility and the accompanying radio-frequency (RF) cable flexure, which impact phase stability and measurement accuracy. The stability of THz VNA system is studied for four VNA extension setups at waveguide frequency bands from 75 GHz up to 1.5 THz. The upper bound of phase error caused by RF cable flexure is determined up to 330 GHz. The influence of the considered uncertainty is demonstrated by a degradation in the range accuracy and distortion in the image quality of a 2-D THz imaging scenario.",

keywords = "SAR imaging, Terahertz, cable flexure, localization, measurement uncertainty, phase stability, vector network analyzer",

author = "Yamen Zantah and Aman Batra and Andreas Prokscha and Fawad Sheikh and Muhammad Haidar and Nidal Zarifeh and Abbas, \{Ali Alhaj\} and Thomas Kaiser",

note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 6th International Workshop on Mobile Terahertz Systems, IWMTS 2023 ; Conference date: 03-07-2023 Through 05-07-2023",

year = "2023",

doi = "10.1109/IWMTS58186.2023.10207852",

language = "English",

series = "2023 6th International Workshop on Mobile Terahertz Systems, IWMTS 2023",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2023 6th International Workshop on Mobile Terahertz Systems, IWMTS 2023",

address = "United States",

}

Zantah, Y, Batra, A, Prokscha, A, Sheikh, F, Haidar, M, Zarifeh, N, Abbas, AA & Kaiser, T 2023, Experimental Analysis of VNA-based Measurement Errors in Mobile THz Applications. in 2023 6th International Workshop on Mobile Terahertz Systems, IWMTS 2023. 2023 6th International Workshop on Mobile Terahertz Systems, IWMTS 2023, Institute of Electrical and Electronics Engineers Inc., 6th International Workshop on Mobile Terahertz Systems, IWMTS 2023, Bonn, Germany, 3/07/23. https://doi.org/10.1109/IWMTS58186.2023.10207852

Experimental Analysis of VNA-based Measurement Errors in Mobile THz Applications. / Zantah, Yamen; Batra, Aman; Prokscha, Andreas et al.
2023 6th International Workshop on Mobile Terahertz Systems, IWMTS 2023. Institute of Electrical and Electronics Engineers Inc., 2023. (2023 6th International Workshop on Mobile Terahertz Systems, IWMTS 2023).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Experimental Analysis of VNA-based Measurement Errors in Mobile THz Applications

AU - Zantah, Yamen

AU - Batra, Aman

AU - Prokscha, Andreas

AU - Sheikh, Fawad

AU - Haidar, Muhammad

AU - Zarifeh, Nidal

AU - Abbas, Ali Alhaj

AU - Kaiser, Thomas

PY - 2023

Y1 - 2023

N2 - Terahertz (THz) measurement systems are crucial for the performance validation and testing of innovative designs and components to verify their reliability towards designated THz applications. This paper investigates the measurement uncertainty of THz measurement setup based on Vector Network Analyzer (VNA) with frequency extension modules. Our work focuses on the effects of equipment mobility and the accompanying radio-frequency (RF) cable flexure, which impact phase stability and measurement accuracy. The stability of THz VNA system is studied for four VNA extension setups at waveguide frequency bands from 75 GHz up to 1.5 THz. The upper bound of phase error caused by RF cable flexure is determined up to 330 GHz. The influence of the considered uncertainty is demonstrated by a degradation in the range accuracy and distortion in the image quality of a 2-D THz imaging scenario.

AB - Terahertz (THz) measurement systems are crucial for the performance validation and testing of innovative designs and components to verify their reliability towards designated THz applications. This paper investigates the measurement uncertainty of THz measurement setup based on Vector Network Analyzer (VNA) with frequency extension modules. Our work focuses on the effects of equipment mobility and the accompanying radio-frequency (RF) cable flexure, which impact phase stability and measurement accuracy. The stability of THz VNA system is studied for four VNA extension setups at waveguide frequency bands from 75 GHz up to 1.5 THz. The upper bound of phase error caused by RF cable flexure is determined up to 330 GHz. The influence of the considered uncertainty is demonstrated by a degradation in the range accuracy and distortion in the image quality of a 2-D THz imaging scenario.

KW - SAR imaging

KW - Terahertz

KW - cable flexure

KW - localization

KW - measurement uncertainty

KW - phase stability

KW - vector network analyzer

UR - https://www.scopus.com/pages/publications/85169473632

U2 - 10.1109/IWMTS58186.2023.10207852

DO - 10.1109/IWMTS58186.2023.10207852

M3 - Conference contribution

AN - SCOPUS:85169473632

T3 - 2023 6th International Workshop on Mobile Terahertz Systems, IWMTS 2023

BT - 2023 6th International Workshop on Mobile Terahertz Systems, IWMTS 2023

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 6th International Workshop on Mobile Terahertz Systems, IWMTS 2023

Y2 - 3 July 2023 through 5 July 2023

ER -

Zantah Y, Batra A, Prokscha A, Sheikh F, Haidar M, Zarifeh N et al. Experimental Analysis of VNA-based Measurement Errors in Mobile THz Applications. In 2023 6th International Workshop on Mobile Terahertz Systems, IWMTS 2023. Institute of Electrical and Electronics Engineers Inc. 2023. (2023 6th International Workshop on Mobile Terahertz Systems, IWMTS 2023). doi: 10.1109/IWMTS58186.2023.10207852

Experimental Analysis of VNA-based Measurement Errors in Mobile THz Applications

Abstract

Publication series

Conference

Bibliographical note

Keywords

ASJC Scopus subject areas

Access to Document

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Cite this