EVOLUTION OF AN LSI DEVICE MODELING SYSTEM.

Kenneth P. Wacks^*, Frederick J. Hill, Manzer Masud, Peter de Bruyn Kops

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Name	Automatic Testing

ASJC Scopus subject areas

@inproceedings{91ea11970edb479aae589d11a5a71364,

title = "EVOLUTION OF AN LSI DEVICE MODELING SYSTEM.",

author = "Wacks, \{Kenneth P.\} and Hill, \{Frederick J.\} and Manzer Masud and \{de Bruyn Kops\}, Peter",

year = "1980",

language = "English",

isbn = "0904999793",

series = "Automatic Testing",

publisher = "NETWORK",

pages = "131--142",

booktitle = "Automatic Testing",

}

TY - GEN

T1 - EVOLUTION OF AN LSI DEVICE MODELING SYSTEM.

AU - Wacks, Kenneth P.

AU - Hill, Frederick J.

AU - Masud, Manzer

AU - de Bruyn Kops, Peter

PY - 1980

Y1 - 1980

UR - https://www.scopus.com/pages/publications/0019090703

M3 - Conference contribution

AN - SCOPUS:0019090703

SN - 0904999793

T3 - Automatic Testing

SP - 131

EP - 142

BT - Automatic Testing

PB - NETWORK

ER -