Abstract
Dielectrophoresis (DEP) has emerged as a powerful technique for manipulating and analyzing particles based on their polarizability differences in electric fields. However, the analysis of DEP data often involves complex computational analysis methods and requires significant expertise. In this study, we propose a novel approach to enhance DEP analysis through the integration of artificial intelligence (AI) techniques. By leveraging AI algorithms such as image processing and velocity recognition, we aim to streamline the analysis process, improve accuracy, and enable real-Time decision-making. This integration allows for automated classification of particles, identification of subtle patterns, and optimization of experimental parameters.The proposed method should revolutionize DEP analysis, paving the way for advancements in various fields such as biotechnology, nanotechnology, and medical diagnostics.
Original language | English |
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Title of host publication | 2024 16th IEEE International Conference on Semiconductor Electronics, ICSE 2024 - Proceedings |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 116-119 |
Number of pages | 4 |
ISBN (Electronic) | 9798350378313 |
DOIs | |
State | Published - 2024 |
Event | 16th IEEE International Conference on Semiconductor Electronics, ICSE 2024 - Kuala Lumpur, Malaysia Duration: 19 Aug 2024 → 21 Aug 2024 |
Publication series
Name | IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE |
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Conference
Conference | 16th IEEE International Conference on Semiconductor Electronics, ICSE 2024 |
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Country/Territory | Malaysia |
City | Kuala Lumpur |
Period | 19/08/24 → 21/08/24 |
Bibliographical note
Publisher Copyright:© 2024 IEEE.
Keywords
- Analysis
- Dielectrophoresis
- Integration
- artificial intelligence
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials