Electronically tunable capacitance multiplier and frequency-dependent negative-resistance simulator using the current-controlled current conveyor

M. T. Abuelma'Atti; N. A. Tasadduq

doi:10.1016/S0026-2692(99)00025-7

Electronically tunable capacitance multiplier and frequency-dependent negative-resistance simulator using the current-controlled current conveyor

M. T. Abuelma'Atti
, N. A. Tasadduq

King Fahd University of Petroleum & Minerals

Research output: Contribution to journal › Article › peer-review

118 Scopus citations

Abstract

Electronically tunable capacitance multipliers and a frequency-dependent negative-resistance (FDNR) are presented in this article. The multiplying factors of the capacitance multipliers and the value of the FDNR are tunable by adjusting the bias current of a plus-type current-controlled current-conveyor (CCCII+). The feasibility of obtaining temperature-independent capacitance multiplication factors is explored and the SPICE simulation results included.

Original language	English
Pages (from-to)	869-873
Number of pages	5
Journal	Microelectronics Journal
Volume	30
Issue number	9
DOIs	https://doi.org/10.1016/S0026-2692(99)00025-7
State	Published - Sep 1999

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Surfaces, Coatings and Films
Electrical and Electronic Engineering

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10.1016/S0026-2692(99)00025-7

Cite this

@article{15237bdb906b448489ae5fe681956168,

title = "Electronically tunable capacitance multiplier and frequency-dependent negative-resistance simulator using the current-controlled current conveyor",

abstract = "Electronically tunable capacitance multipliers and a frequency-dependent negative-resistance (FDNR) are presented in this article. The multiplying factors of the capacitance multipliers and the value of the FDNR are tunable by adjusting the bias current of a plus-type current-controlled current-conveyor (CCCII+). The feasibility of obtaining temperature-independent capacitance multiplication factors is explored and the SPICE simulation results included.",

author = "Abuelma'Atti, \{M. T.\} and Tasadduq, \{N. A.\}",

year = "1999",

month = sep,

doi = "10.1016/S0026-2692(99)00025-7",

language = "English",

volume = "30",

pages = "869--873",

journal = "Microelectronics Journal",

issn = "0026-2692",

publisher = "Elsevier Ltd.",

number = "9",

}

TY - JOUR

T1 - Electronically tunable capacitance multiplier and frequency-dependent negative-resistance simulator using the current-controlled current conveyor

AU - Abuelma'Atti, M. T.

AU - Tasadduq, N. A.

PY - 1999/9

Y1 - 1999/9

N2 - Electronically tunable capacitance multipliers and a frequency-dependent negative-resistance (FDNR) are presented in this article. The multiplying factors of the capacitance multipliers and the value of the FDNR are tunable by adjusting the bias current of a plus-type current-controlled current-conveyor (CCCII+). The feasibility of obtaining temperature-independent capacitance multiplication factors is explored and the SPICE simulation results included.

AB - Electronically tunable capacitance multipliers and a frequency-dependent negative-resistance (FDNR) are presented in this article. The multiplying factors of the capacitance multipliers and the value of the FDNR are tunable by adjusting the bias current of a plus-type current-controlled current-conveyor (CCCII+). The feasibility of obtaining temperature-independent capacitance multiplication factors is explored and the SPICE simulation results included.

UR - https://www.scopus.com/pages/publications/0032670666

U2 - 10.1016/S0026-2692(99)00025-7

DO - 10.1016/S0026-2692(99)00025-7

M3 - Article

AN - SCOPUS:0032670666

SN - 0026-2692

VL - 30

SP - 869

EP - 873

JO - Microelectronics Journal

JF - Microelectronics Journal

IS - 9

ER -

Electronically tunable capacitance multiplier and frequency-dependent negative-resistance simulator using the current-controlled current conveyor

Abstract

ASJC Scopus subject areas

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