Electronic Reliability and Error Performance Analysis of RIS-Aided Communication Networks

This article explores the critical aspect of electronic hardware reliability analysis in reconfigurable intelligent surface (RIS)-aided networks within the context of sixth-generation (6G) communications. Recognizing the potential vulnerabilities of metasurfaces to environmental factors, we highlight the continuous hardware impairments that can significantly impact the electromagnetic properties of RISs, reducing their lifetime. Extending the life cycle of RISs is strategically important, especially in mission-critical ultra-reliable wireless applications where system failures can result in significant costs and, in extreme cases, necessitate structural replacements. Accordingly, we investigate the nonresidual continuous hardware degradation of RISs through a stochastic process and optimize maintenance strategies using statistical information to extend the RIS system's lifespan. The optimal life expectancy of the RIS system with systematic maintenance concerning the observed impairment level is demonstrated through analytical results. The findings indicate that the information-based framework can significantly extend the expected life of a RIS system by postponing maintenance. Furthermore, a comprehensive mathematical framework for reliable communication is introduced, whereby the distribution of the received SINR is determined in the presence of hardware impairment due to imperfect maintenance. Through extensive numerical simulations, the efficacy and robustness of the proposed framework under hardware impairments are illustrated.