ELECTROCHEMICAL DETERIORATION OF SEMI-CONDUCTING GLAZE ON INSULATOR SURFACES.

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Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	344-350
Number of pages	7
Journal	Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report
DOIs	https://doi.org/10.1109/eidp.1981.7684673
State	Published - 1981

ASJC Scopus subject areas

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title = "ELECTROCHEMICAL DETERIORATION OF SEMI-CONDUCTING GLAZE ON INSULATOR SURFACES.",

author = "Wu, \{C. Y.\} and Wu, \{C. T.\} and Cheng, \{T. C.\}",

year = "1981",

doi = "10.1109/eidp.1981.7684673",

language = "English",

pages = "344--350",

journal = "Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report",

issn = "0084-9162",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - JOUR

T1 - ELECTROCHEMICAL DETERIORATION OF SEMI-CONDUCTING GLAZE ON INSULATOR SURFACES.

AU - Wu, C. Y.

AU - Wu, C. T.

AU - Cheng, T. C.

PY - 1981

Y1 - 1981

UR - https://www.scopus.com/pages/publications/0019678489

U2 - 10.1109/eidp.1981.7684673

DO - 10.1109/eidp.1981.7684673

M3 - Conference article

AN - SCOPUS:0019678489

SN - 0084-9162

SP - 344

EP - 350

JO - Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report

JF - Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report

ER -