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Efficient sensitivity analysis of waveguide structures using Finite Element Method (FEM)

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We discuss a novel finite element method-based technique for estimating accurate sensitivities of the desired response. Our technique utilizes the central adjoint variable method (CAVM) for estimating the response sensitivities. This approach features accuracy comparable to that of the central finite difference (CFD) approximation at the response level. Our approach uses a simple perturbation method to calculate the sensitivity of modal parameters of various waveguide structures with respect to the geometric and material parameters. No additional simulation is required to calculate the response and its sensitivity with respect to all the design parameters. The accuracy of our approach is illustrated by comparing the results with the second order accurate CFD applied on the response level. Our results show a very good agreement between the CAVM-based sensitivities and those obtained using the expensive central.

Original languageEnglish
Title of host publicationPhysics and Simulation of Optoelectronic Devices XXI
DOIs
StatePublished - 2013
Externally publishedYes
EventPhysics and Simulation of Optoelectronic Devices XXI - San Francisco, CA, United States
Duration: 4 Feb 20137 Feb 2013

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8619
ISSN (Print)0277-786X

Conference

ConferencePhysics and Simulation of Optoelectronic Devices XXI
Country/TerritoryUnited States
CitySan Francisco, CA
Period4/02/137/02/13

Keywords

  • Adjoint Variable Method (AVM)
  • Finite Element Method (FEM)
  • Sensitivity analysis
  • Waveguides

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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