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Efficient Protection of FPGA Implemented LDPC Decoders Against Single Event Upsets (SEUs) on Configuration Memories

  • Zhen Gao*
  • , Yinghao Cheng
  • , Qiang Liu
  • , Anees Ullah
  • , Pedro Reviriego
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

Low Density Parity Check (LDPC) codes are used in 5G systems for traffic channels due to their excellent error correction capability for long sequences, and the Min-Sum algorithm is widely applied in practical implementations of LDPC decoders due to its low complexity. If the decoder is implemented on a SRAM-based field-programmable gate array (SRAM-FPGA), the radiation-induced single-event upsets (SEUs) can affect the operation of the LDPC decoder by corrupting the configuration memory, which can change the circuit functionality and will not be corrected unless the FPGA is reconfigured. Therefore, protection of LDPC decoders with low overhead is an important problem, especially for resource-limited on-board space systems. In this paper, an efficient Duplicate With Comparison (DWC) protection scheme is proposed based on the different distribution of the parity check sum of the LDPC decoder in the error-free case and the faulty case. In particular, the check sum accumulation number and threshold are optimized to achieve high detection probability with short delay. FPGA based implementation and hardware fault injection experiments are conducted to evaluate the performance of the proposed schemes. Experimental results show that, the effect of SEUs on the LDPC decoder can be completely eliminated by the proposed scheme with 2 times computational overhead and 1.69 times power consumption overhead compared to the unprotected decoder.

Original languageEnglish
Pages (from-to)3770-3780
Number of pages11
JournalIEEE Transactions on Circuits and Systems I: Regular Papers
Volume70
Issue number9
DOIs
StatePublished - 1 Sep 2023

Bibliographical note

Publisher Copyright:
© 2004-2012 IEEE.

Keywords

  • configuration memories
  • fault injection
  • fault tolerance
  • LDPC decoders
  • single event upsets
  • SRAM-FPGAs

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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