Efficient minimization of test frequencies for linear analog circuits

Mohand Bentobache; Ahcene Bounceur; Reinhardt Euler; Yann Kieffer; Salvador Mir

doi:10.1109/ETS.2013.6569385

Efficient minimization of test frequencies for linear analog circuits

Mohand Bentobache, Ahcene Bounceur, Reinhardt Euler, Yann Kieffer, Salvador Mir

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

This paper proposes a new technique for the optimization of multi-frequency tests for linear analog circuits. Fault simulation is used to obtain the frequency intervals for the detection of each fault. New efficient algorithms are then presented for the selection of the optimal set of test frequencies within these intervals for the detection of all faults. Numerical simulations with randomly generated problem instances demonstrate the good time complexity of the proposed algorithms, with a large improvement over previous approaches (Mir et al 1996).

Original language	English
Title of host publication	Proceedings - 2013 18th IEEE European Test Symposium, ETS 2013
DOIs	https://doi.org/10.1109/ETS.2013.6569385
State	Published - 2013
Externally published	Yes
Event	2013 18th IEEE European Test Symposium, ETS 2013 - Avignon, France Duration: 27 May 2013 → 30 May 2013

Publication series

Name	Proceedings - 2013 18th IEEE European Test Symposium, ETS 2013

Conference

Conference	2013 18th IEEE European Test Symposium, ETS 2013
Country/Territory	France
City	Avignon
Period	27/05/13 → 30/05/13

Keywords

Analog circuit testing
Consecutive-ones
Interval graphs
Linear programming
Set covering problem

ASJC Scopus subject areas

Software

Access to Document

10.1109/ETS.2013.6569385

Cite this

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title = "Efficient minimization of test frequencies for linear analog circuits",

abstract = "This paper proposes a new technique for the optimization of multi-frequency tests for linear analog circuits. Fault simulation is used to obtain the frequency intervals for the detection of each fault. New efficient algorithms are then presented for the selection of the optimal set of test frequencies within these intervals for the detection of all faults. Numerical simulations with randomly generated problem instances demonstrate the good time complexity of the proposed algorithms, with a large improvement over previous approaches (Mir et al 1996).",

keywords = "Analog circuit testing, Consecutive-ones, Interval graphs, Linear programming, Set covering problem",

author = "Mohand Bentobache and Ahcene Bounceur and Reinhardt Euler and Yann Kieffer and Salvador Mir",

year = "2013",

doi = "10.1109/ETS.2013.6569385",

language = "English",

isbn = "9781467363778",

series = "Proceedings - 2013 18th IEEE European Test Symposium, ETS 2013",

booktitle = "Proceedings - 2013 18th IEEE European Test Symposium, ETS 2013",

note = "2013 18th IEEE European Test Symposium, ETS 2013 ; Conference date: 27-05-2013 Through 30-05-2013",

}

Bentobache, M, Bounceur, A, Euler, R, Kieffer, Y & Mir, S 2013, Efficient minimization of test frequencies for linear analog circuits. in Proceedings - 2013 18th IEEE European Test Symposium, ETS 2013., 6569385, Proceedings - 2013 18th IEEE European Test Symposium, ETS 2013, 2013 18th IEEE European Test Symposium, ETS 2013, Avignon, France, 27/05/13. https://doi.org/10.1109/ETS.2013.6569385

Efficient minimization of test frequencies for linear analog circuits. / Bentobache, Mohand; Bounceur, Ahcene; Euler, Reinhardt et al.
Proceedings - 2013 18th IEEE European Test Symposium, ETS 2013. 2013. 6569385 (Proceedings - 2013 18th IEEE European Test Symposium, ETS 2013).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Efficient minimization of test frequencies for linear analog circuits

AU - Bentobache, Mohand

AU - Bounceur, Ahcene

AU - Euler, Reinhardt

AU - Kieffer, Yann

AU - Mir, Salvador

PY - 2013

Y1 - 2013

N2 - This paper proposes a new technique for the optimization of multi-frequency tests for linear analog circuits. Fault simulation is used to obtain the frequency intervals for the detection of each fault. New efficient algorithms are then presented for the selection of the optimal set of test frequencies within these intervals for the detection of all faults. Numerical simulations with randomly generated problem instances demonstrate the good time complexity of the proposed algorithms, with a large improvement over previous approaches (Mir et al 1996).

AB - This paper proposes a new technique for the optimization of multi-frequency tests for linear analog circuits. Fault simulation is used to obtain the frequency intervals for the detection of each fault. New efficient algorithms are then presented for the selection of the optimal set of test frequencies within these intervals for the detection of all faults. Numerical simulations with randomly generated problem instances demonstrate the good time complexity of the proposed algorithms, with a large improvement over previous approaches (Mir et al 1996).

KW - Analog circuit testing

KW - Consecutive-ones

KW - Interval graphs

KW - Linear programming

KW - Set covering problem

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U2 - 10.1109/ETS.2013.6569385

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M3 - Conference contribution

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Y2 - 27 May 2013 through 30 May 2013

ER -

Efficient minimization of test frequencies for linear analog circuits

Abstract

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Keywords

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