Effect of annealing on the magnetic properties and performance of cold-drawn micro Ni80Fe20/Cu wires in magnetic sensors
- H. L. Seet*
- , X. P. Li
- , K. S. Lee
- , K. Y. Yee
- , L. Q. Liang
- , J. B. Yi
*Corresponding author for this work
Research output: Contribution to journal › Conference article › peer-review
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