Skip to main navigation Skip to search Skip to main content

Durability of HALS-stabilized polyethylene film in a greenhouse environment

  • Javaid H. Khan*
  • , S. Halim Hamid
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

50 Scopus citations

Abstract

Low-density polyethylene-based greenhouse films have been monitored for outdoor weather effects by mounting the film on a model greenhouse and on aluminum exposure racks at Dhahran plastic exposure facility. The change in chemical properties was monitored by Fourier transform infrared (FTIR) spectroscopy. The thermal properties were observed by differential scanning calorimetry (DSC) and the drop in percent elongation and stress at break was monitored. It is concluded that greenhouse film mounted on the model greenhouse degraded more in comparison to the film on aluminum racks. The spectral emissions with wavelength between 7 and 14 μm are an important part of the energy losses from the soil and the plants inside a greenhouse. The partial prevention of the dissipation of this thermal energy from the greenhouse film during cool night hours creates a unique environment and influences the degradation reactions in the plastic film Pesticides, mostly sulfur- and halogen-based compounds, can also accelerate the degradation of the film.

Original languageEnglish
Pages (from-to)137-142
Number of pages6
JournalPolymer Degradation and Stability
Volume48
Issue number1
DOIs
StatePublished - 1995

Bibliographical note

Funding Information:
The authors thank the Research Institute, King Fahd University of Petroleum and Minerals, for the support of this research, and Ikram Husain and Niaz Ahmed for their help in mechanical testing.

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Mechanics of Materials
  • Polymers and Plastics
  • Materials Chemistry

Fingerprint

Dive into the research topics of 'Durability of HALS-stabilized polyethylene film in a greenhouse environment'. Together they form a unique fingerprint.

Cite this