Abstract
The so-called "cross-relaxation" method is a powerful technique that can be used to provide detailed structural and site information on impurities in condensed matter systems, including semiconductors. In this paper, we report on the progress of its development at the new 8Li β-detected nuclear magnetic resonance (β-NMR) facility located in TRIUMF in Vancouver, Canada. We present first measurements using this method on a Cu single crystal and discuss future application for studies of isolated impurities in semiconductors.
| Original language | English |
|---|---|
| Pages (from-to) | 662-665 |
| Number of pages | 4 |
| Journal | Physica B: Condensed Matter |
| Volume | 401-402 |
| DOIs | |
| State | Published - 15 Dec 2007 |
| Externally published | Yes |
Keywords
- Cross relaxation
- Lithium
- Site
- Structure
- β-Detected NMR
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering