Development of the 8Li cross-relaxation technique: Applications in semiconductors and other condensed matter systems

  • A. I. Mansour
  • , G. D. Morris
  • , Z. Salman
  • , K. H. Chow*
  • , T. Dunlop
  • , J. Jung
  • , I. Fan
  • , W. A. MacFarlane
  • , R. F. Kiefl
  • , T. J. Parolin
  • , H. Saadaoui
  • , D. Wang
  • , M. D. Hossain
  • , Q. Song
  • , M. Smadella
  • , O. Mosendz
  • , B. Kardasz
  • , B. Heinrich
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

The so-called "cross-relaxation" method is a powerful technique that can be used to provide detailed structural and site information on impurities in condensed matter systems, including semiconductors. In this paper, we report on the progress of its development at the new 8Li β-detected nuclear magnetic resonance (β-NMR) facility located in TRIUMF in Vancouver, Canada. We present first measurements using this method on a Cu single crystal and discuss future application for studies of isolated impurities in semiconductors.

Original languageEnglish
Pages (from-to)662-665
Number of pages4
JournalPhysica B: Condensed Matter
Volume401-402
DOIs
StatePublished - 15 Dec 2007
Externally publishedYes

Keywords

  • Cross relaxation
  • Lithium
  • Site
  • Structure
  • β-Detected NMR

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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