Abstract
In this study, the blade coating technique was used for gettinge ZnO films and characterized using X-ray diffraction (XRD) analysis. The analysis indicated that ZnO particle was crystallite nature along with a usual hexagonal wurtzite sturcture. The X-ray peak profile analysis (XPPA) was used to validate the crystallite development. Williamson-Hall (W-H) and size-strain plot (SSP) analysis were implemented to determine the crystallite sizes (D) and the lattice strain (ϵ) of ZnO nanoparticles. XRD peaks were further studied to determine the some of the physical parameters including lattice strain, crystal stress, and energy density. Here, we have calculated the above mentioned parameters using few modified forms of W-H models and compared the results of the parameters that have been obtained from various methods. The study reveals that the crystallite parameters evaluated from various model are almost similar.
| Original language | English |
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| Title of host publication | 2018 International Conference on Innovations in Science, Engineering and Technology, ICISET 2018 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 257-261 |
| Number of pages | 5 |
| ISBN (Electronic) | 9781538685242 |
| DOIs | |
| State | Published - Oct 2018 |
Publication series
| Name | 2018 International Conference on Innovations in Science, Engineering and Technology, ICISET 2018 |
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Bibliographical note
Publisher Copyright:© 2018 IEEE.
Keywords
- SSP method
- W-H analysis
- X-ray diffraction (XRD)
- ZnO nanoparticles
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Instrumentation
- Computer Networks and Communications
- Computer Science Applications
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering