Skip to main navigation Skip to search Skip to main content

Determination of the optical constants (n and k) of inhomogeneous thin films with linear index profiles

Research output: Contribution to journalArticlepeer-review

15 Scopus citations

Abstract

A new method for the determination of optical constants of absorbing inhomogeneous thin films is proposed. It requires measurements at normal incidence of the reflectance and transmittance of the film In an inhomogeneous thin film, the optical constants vary along the thickness of the film. It has been reported in the literature that only the spatial integral value of the absorption index needs to be considered if its value is small. Therefore, in the proposed method, the mean value of the absorption index was used. The validity of this assumption was tested. On the other hand, the variation in the refractive index along the thickness of the film was taken into account. The method is discussed along with the nature of the solutions obtained and the effects of various parameters and assumptions. The method is applied successfully to inhomogeneous thin films of zirconium oxide.

Original languageEnglish
Pages (from-to)4591-4597
Number of pages7
JournalApplied Optics
Volume45
Issue number19
DOIs
StatePublished - 1 Jul 2006

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Determination of the optical constants (n and k) of inhomogeneous thin films with linear index profiles'. Together they form a unique fingerprint.

Cite this