Abstract
An analytical method of determination of all the four diode parameters of the single exponential model of a silicon solar cell, namely shunt resistance Rsh, series resistance Rs, diode ideality factor n and reverse saturation current I0 from the variation of slopes of the I-V curve of the cell near short circuit and open circuit conditions with intensity of illumination in a small range of intensity, is presented for the first time. In a suitable range of intensity the variation of dI/dV at short circuit enables determination of Rsh, whereas the variation of dI/dV at open circuit enables determination of Rs, n and I0. The diode parameters of a silicon solar cell were determined with this method using I-V characteristics of the cell in 40-125 mW cm-2 intensity range of a simulated AM1.5 solar radiation. Theoretical I-V curves generated using so determined values of the diode parameters matched well with the experimental I-V curves of the cell obtained under various intensities of illumination in the above range.
| Original language | English |
|---|---|
| Article number | 015002 |
| Journal | Semiconductor Science and Technology |
| Volume | 25 |
| Issue number | 1 |
| DOIs | |
| State | Published - 2010 |
| Externally published | Yes |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry
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