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Design and Implementation of Configuration Memory SEU-Tolerant Viterbi Decoders in SRAM-Based FPGAs

  • Zhen Gao*
  • , Jinhua Zhu
  • , Ruishi Han
  • , Zhan Xu
  • , Anees Ullah
  • , Pedro Reviriego
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

22 Scopus citations

Abstract

A Viterbi decoder is used in many communication receivers to efficiently decode the received signal that has been convolutional encoded in the transmitter. This decoding corrects errors that occur due to noise and other imperfections in the channel and is key to achieve a low bit error rate. If the decoder is implemented on a SRAM-based field-programmable gate array (SRAM-FPGA), the radiation-induced soft errors can affect the operation of the Viterbi decoder by corrupting the configuration memory, which can change the circuit functionality and will not be corrected unless the FPGA is reconfigured. This makes the protection of Viterbi decoders implemented on SRAM-based FPGAs an important issue. In this paper, first, fault injection experiments are conducted to study the effects of soft errors on the configuration memory of an SRAM-FPGA implemented Viterbi decoder. Then, an efficient protection technique is proposed and evaluated showing that it can provide an efficient protection with a lower resource usage than the traditional triple modular redundancy approach.

Original languageEnglish
Article number8758450
Pages (from-to)691-699
Number of pages9
JournalIEEE Transactions on Nanotechnology
Volume18
DOIs
StatePublished - 2019

Bibliographical note

Publisher Copyright:
© 2002-2012 IEEE.

Keywords

  • duplication with comparison
  • fault tolerance
  • FPGA
  • single event upset
  • Viterbi decoding

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering

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