Depth profiling of a single crystal of YBCO superconductor using micro-PIXE technique

M. Ahmed; M. Faiz; M. A. Al-Ohali; O. Fageeha

doi:10.1016/S0168-583X(97)00472-2

Depth profiling of a single crystal of YBCO superconductor using micro-PIXE technique

M. Ahmed^*
, M. Faiz
, M. A. Al-Ohali
, O. Fageeha

^*Corresponding author for this work

King Fahd University of Petroleum & Minerals

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

Elemental depth profiling of a small single crystal (1.5 mm x 1.3 mm x 0.1 mm) of a YBCO superconductor was carried out non-destructively by scanning its thickness with a proton microbeam, and analyzing the characteristic X-rays produced (the micro-PIXE technique). Elemental composition spectra, two-dimensional elemental distribution maps, and one-dimensional line scan spectra from several parts of the thickness were acquired. The results are discussed in the light of the method used for growing the crystal and on the basis of the electronic structure theory of the high-T_c superconducting compounds.

Original language	English
Pages (from-to)	507-512
Number of pages	6
Journal	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume	132
Issue number	3
DOIs	https://doi.org/10.1016/S0168-583X(97)00472-2
State	Published - Nov 1997

Bibliographical note

Funding Information:
The authors acknowledge the support of the Research Institute, King Fahd University of Pet-roleun and Minerals, Dhahran. Saudi Arabia for this work. Thanks are due to S. Madhusoodhanan Pillai. Tandetron Accelerator Operator for technical assistance.

ASJC Scopus subject areas

Nuclear and High Energy Physics
Instrumentation

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Cite this

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title = "Depth profiling of a single crystal of YBCO superconductor using micro-PIXE technique",

abstract = "Elemental depth profiling of a small single crystal (1.5 mm x 1.3 mm x 0.1 mm) of a YBCO superconductor was carried out non-destructively by scanning its thickness with a proton microbeam, and analyzing the characteristic X-rays produced (the micro-PIXE technique). Elemental composition spectra, two-dimensional elemental distribution maps, and one-dimensional line scan spectra from several parts of the thickness were acquired. The results are discussed in the light of the method used for growing the crystal and on the basis of the electronic structure theory of the high-Tc superconducting compounds.",

author = "M. Ahmed and M. Faiz and Al-Ohali, \{M. A.\} and O. Fageeha",

note = "Funding Information: The authors acknowledge the support of the Research Institute, King Fahd University of Pet-roleun and Minerals, Dhahran. Saudi Arabia for this work. Thanks are due to S. Madhusoodhanan Pillai. Tandetron Accelerator Operator for technical assistance.",

year = "1997",

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doi = "10.1016/S0168-583X(97)00472-2",

language = "English",

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AU - Ahmed, M.

AU - Faiz, M.

AU - Al-Ohali, M. A.

AU - Fageeha, O.

N1 - Funding Information: The authors acknowledge the support of the Research Institute, King Fahd University of Pet-roleun and Minerals, Dhahran. Saudi Arabia for this work. Thanks are due to S. Madhusoodhanan Pillai. Tandetron Accelerator Operator for technical assistance.

PY - 1997/11

Y1 - 1997/11

N2 - Elemental depth profiling of a small single crystal (1.5 mm x 1.3 mm x 0.1 mm) of a YBCO superconductor was carried out non-destructively by scanning its thickness with a proton microbeam, and analyzing the characteristic X-rays produced (the micro-PIXE technique). Elemental composition spectra, two-dimensional elemental distribution maps, and one-dimensional line scan spectra from several parts of the thickness were acquired. The results are discussed in the light of the method used for growing the crystal and on the basis of the electronic structure theory of the high-Tc superconducting compounds.

AB - Elemental depth profiling of a small single crystal (1.5 mm x 1.3 mm x 0.1 mm) of a YBCO superconductor was carried out non-destructively by scanning its thickness with a proton microbeam, and analyzing the characteristic X-rays produced (the micro-PIXE technique). Elemental composition spectra, two-dimensional elemental distribution maps, and one-dimensional line scan spectra from several parts of the thickness were acquired. The results are discussed in the light of the method used for growing the crystal and on the basis of the electronic structure theory of the high-Tc superconducting compounds.

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DO - 10.1016/S0168-583X(97)00472-2

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SN - 0168-583X

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JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

IS - 3

ER -

Depth profiling of a single crystal of YBCO superconductor using micro-PIXE technique

Abstract

Bibliographical note

ASJC Scopus subject areas

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