Density of thin vapour-deposited films of zinc selenide

E. E. Khawaja; S. M.A. Durrani; A. B. Hallak; M. A. Salim; M. S. Hussain

doi:10.1088/0022-3727/27/5/019

Density of thin vapour-deposited films of zinc selenide

E. E. Khawaja, S. M.A. Durrani, A. B. Hallak, M. A. Salim, M. S. Hussain

King Fahd University of Petroleum & Minerals

Research output: Contribution to journal › Article › peer-review

20 Scopus citations

Abstract

The density of thin vapour-deposited films of zinc selenide was determined by spectrophotometry combined with Rutherford backscattering spectrometry. Bulk stoichiometry of the films was measured by Rutherford backscattering spectroscopy. It was found that the films were relatively rich in Se. Depth profile study of the films, by x-ray photoelectron spectroscopy, revealed that surfaces were rich in Se while, away from the surface and inside the film, the Se content decreased with depth until the stoichiometric ratio of the compound ZnSe was reached. The density determined was 0.93+or-3% of the bulk value for ZnSe.

Original language	English
Pages (from-to)	1008-1013
Number of pages	6
Journal	Journal of Physics D: Applied Physics
Volume	27
Issue number	5
DOIs	https://doi.org/10.1088/0022-3727/27/5/019
State	Published - 14 May 1994

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Acoustics and Ultrasonics
Surfaces, Coatings and Films

Access to Document

10.1088/0022-3727/27/5/019

Cite this

@article{95a660fca5d84000b13a2ca6158cc4c1,

title = "Density of thin vapour-deposited films of zinc selenide",

abstract = "The density of thin vapour-deposited films of zinc selenide was determined by spectrophotometry combined with Rutherford backscattering spectrometry. Bulk stoichiometry of the films was measured by Rutherford backscattering spectroscopy. It was found that the films were relatively rich in Se. Depth profile study of the films, by x-ray photoelectron spectroscopy, revealed that surfaces were rich in Se while, away from the surface and inside the film, the Se content decreased with depth until the stoichiometric ratio of the compound ZnSe was reached. The density determined was 0.93+or-3% of the bulk value for ZnSe.",

author = "Khawaja, {E. E.} and Durrani, {S. M.A.} and Hallak, {A. B.} and Salim, {M. A.} and Hussain, {M. S.}",

year = "1994",

month = may,

day = "14",

doi = "10.1088/0022-3727/27/5/019",

language = "English",

volume = "27",

pages = "1008--1013",

journal = "Journal of Physics D: Applied Physics",

issn = "0022-3727",

publisher = "Institute of Physics",

number = "5",

}

TY - JOUR

T1 - Density of thin vapour-deposited films of zinc selenide

AU - Khawaja, E. E.

AU - Durrani, S. M.A.

AU - Hallak, A. B.

AU - Salim, M. A.

AU - Hussain, M. S.

PY - 1994/5/14

Y1 - 1994/5/14

N2 - The density of thin vapour-deposited films of zinc selenide was determined by spectrophotometry combined with Rutherford backscattering spectrometry. Bulk stoichiometry of the films was measured by Rutherford backscattering spectroscopy. It was found that the films were relatively rich in Se. Depth profile study of the films, by x-ray photoelectron spectroscopy, revealed that surfaces were rich in Se while, away from the surface and inside the film, the Se content decreased with depth until the stoichiometric ratio of the compound ZnSe was reached. The density determined was 0.93+or-3% of the bulk value for ZnSe.

AB - The density of thin vapour-deposited films of zinc selenide was determined by spectrophotometry combined with Rutherford backscattering spectrometry. Bulk stoichiometry of the films was measured by Rutherford backscattering spectroscopy. It was found that the films were relatively rich in Se. Depth profile study of the films, by x-ray photoelectron spectroscopy, revealed that surfaces were rich in Se while, away from the surface and inside the film, the Se content decreased with depth until the stoichiometric ratio of the compound ZnSe was reached. The density determined was 0.93+or-3% of the bulk value for ZnSe.

UR - http://www.scopus.com/inward/record.url?scp=0028426295&partnerID=8YFLogxK

U2 - 10.1088/0022-3727/27/5/019

DO - 10.1088/0022-3727/27/5/019

M3 - Article

AN - SCOPUS:0028426295

SN - 0022-3727

VL - 27

SP - 1008

EP - 1013

JO - Journal of Physics D: Applied Physics

JF - Journal of Physics D: Applied Physics

IS - 5

ER -

Density of thin vapour-deposited films of zinc selenide

Abstract

ASJC Scopus subject areas

Access to Document

Fingerprint

Cite this