Abstract
The density of thin vapor-deposited films of cadmium sulfide was determined by spectrophotometry combined with Rutherford backscattering spectrometry. The density determined was 0.95 ± 7% of the bulk value for the CdS. The Lorentz-Lorenz law, based upon the measured data on the index of refraction of the films, suggests a value of the density of the films close to the one obtained in the present work.
| Original language | English |
|---|---|
| Pages (from-to) | 89-94 |
| Number of pages | 6 |
| Journal | Arabian Journal for Science and Engineering |
| Volume | 25 |
| Issue number | 2A |
| State | Published - Jul 2000 |
ASJC Scopus subject areas
- General