Defect formation on BaF2 by single impact of highly charged ions

S. Facsko; A. S. El-Said; R. Wilhelm; R. Heller

doi:10.1088/1742-6596/388/13/132033

Defect formation on BaF₂ by single impact of highly charged ions

S. Facsko^*
, A. S. El-Said
, R. Wilhelm
, R. Heller

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Abstract

The impact of highly charged ions on freshly cleaved BaF₂ (100) surfaces produces areas with a high amount of defects. In order to make these defect agglomerates visible, they are etched chemically and analysed with contact atomic force microscopy.

Original language	English
Article number	132033
Journal	Journal of Physics: Conference Series
Volume	388
Issue number	PART 13
DOIs	https://doi.org/10.1088/1742-6596/388/13/132033
State	Published - 2012

ASJC Scopus subject areas

General Physics and Astronomy

Access to Document

10.1088/1742-6596/388/13/132033

Cite this

@article{9935a4fd521a4236a4a02be8f357443a,

title = "Defect formation on BaF2 by single impact of highly charged ions",

abstract = "The impact of highly charged ions on freshly cleaved BaF2 (100) surfaces produces areas with a high amount of defects. In order to make these defect agglomerates visible, they are etched chemically and analysed with contact atomic force microscopy.",

author = "S. Facsko and El-Said, \{A. S.\} and R. Wilhelm and R. Heller",

year = "2012",

doi = "10.1088/1742-6596/388/13/132033",

language = "English",

volume = "388",

journal = "Journal of Physics: Conference Series",

issn = "1742-6588",

publisher = "IOP Publishing Ltd.",

number = "PART 13",

}

TY - JOUR

T1 - Defect formation on BaF2 by single impact of highly charged ions

AU - Facsko, S.

AU - El-Said, A. S.

AU - Wilhelm, R.

AU - Heller, R.

PY - 2012

Y1 - 2012

N2 - The impact of highly charged ions on freshly cleaved BaF2 (100) surfaces produces areas with a high amount of defects. In order to make these defect agglomerates visible, they are etched chemically and analysed with contact atomic force microscopy.

AB - The impact of highly charged ions on freshly cleaved BaF2 (100) surfaces produces areas with a high amount of defects. In order to make these defect agglomerates visible, they are etched chemically and analysed with contact atomic force microscopy.

UR - https://www.scopus.com/pages/publications/84870607272

U2 - 10.1088/1742-6596/388/13/132033

DO - 10.1088/1742-6596/388/13/132033

M3 - Conference article

AN - SCOPUS:84870607272

SN - 1742-6588

VL - 388

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

IS - PART 13

M1 - 132033