Defect formation on BaF2 by single impact of highly charged ions

S. Facsko*, A. S. El-Said, R. Wilhelm, R. Heller

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Abstract

The impact of highly charged ions on freshly cleaved BaF2 (100) surfaces produces areas with a high amount of defects. In order to make these defect agglomerates visible, they are etched chemically and analysed with contact atomic force microscopy.

Original languageEnglish
Article number132033
JournalJournal of Physics: Conference Series
Volume388
Issue numberPART 13
DOIs
StatePublished - 2012

ASJC Scopus subject areas

  • General Physics and Astronomy

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